| 3M | Maintenance, Material, Management System |
| α | Producers Risk |
| β | Consumers Risk |
| λ | Failure Rate (1/Mean Time Between Failure) |
| λA | Part (Active) Failure Rate |
| λP | Part (Passive or Dormant) Failure Rate |
| λT | Total Part (Active) Failure Rate |
| μ | Arithmetic Mean |
| μ | Repair Rate (1/Mean Corrective Maintenance Time) |
| σ | Standard Deviation |
| θ0 | Upper Test (Design Goal) Mean Time Between Failure |
| θ1 | Lower Test (Unacceptable) Mean Time Between Failure |
| θc-a | Case-to-Ambient Thermal Resistance |
| θD | Demonstrated MTBF (Controlled Testing) |
| θj-a | Junction-to-Ambient Thermal Resistance |
| θj-c | Junction-to-Case Thermal Resistance |
| θP | Predicted Mean Time Between Failure |
| θ^ | Observed Point Estimate Mean Time Between Failure |
| A | Ampere |
| A/D | Analog-to-Digital |
| Aa | Achieved Availability |
| Ai | Inherent Availability |
| AIC | Airborne Inhabited Cargo |
| AIF | Airborne Inhabited Fighter |
| Ao | Operational Availability |
| AOL | Open Loop Gain |
| AUC | Airborne Uninhabited Cargo |
| AUF | Airborne Uninhabited Fighter |
| AAA | Allocations Assessment and Analysis |
| ABC | Activity-Based Costing |
| ACC | Air Combat Command |
| ACO | Administrative Contracting Officer |
| ACO | Administrative Contracting Officer |
| ACPM | AMSAA/Crow Projection Model |
| ACQ | Acquisition |
| ACQ | Acquisition |
| ADAS | Architecture Design and Assessment Systems |
| ADAS | Architecture Design and Assessment System |
| ADM | Advanced Development Model |
| ADM | Advanced Development Model |
| ADP | Automatic Data Processing |
| ADP | Automatic Data Processing |
| ADPE | Automatic Data Processing Equipment |
| ADPE | Automatic Data Processing Equipment |
| AEC | Army Evaluation Center |
| AES | Auger Electronic Spectroscopy |
| AETC | Air Education and Training Command |
| AFAE | Air Force Acquisition Executive |
| AFAE | Air Force Acquisition Executive |
| AFCC | Air Force Communication Command |
| AFFSA | Air Force Flight Standards Agency |
| AFFTC | Air Force Flight Test Center |
| AFIT | Air Force Institute of Technology |
| AFLMA | Air Force Logistics Management Agency |
| AFMC | Air Force Materiel Command |
| AFMC | Air Force Materiel Command |
| AFOTEC | Air Force Operational Test and Evaluation Center |
| AFOTEC | Air Force Operational Test and Evaluation Center |
| AFPRO | Air Force Plant Representative Office |
| AFR | Air Force Regulation |
| AFR | Air Force Regulation |
| AFRL | Air Force Research Laboratory |
| AFSOC | Air Force Special Operations Command |
| AFSPC | Air Force Space Command |
| AFTO | Air Force Technical Order |
| AFTO | Air Force Technical Order |
| AGS | Ambiguity Group Size |
| AGS | Ambiguity Group Size |
| AI | Artificial Intelligence |
| Ai | Inherent Availability |
| AI | Artificial Intelligence |
| AJ | Antijam |
| AJ | Antijam |
| ALC | Air Logistics Center |
| ALC | Air Logistics Center |
| ALT | Accelerated Life Testing |
| ALU | Arithmetic Logic Unit |
| ALU | Arithmetic Logic Unit |
| AMC | Air Mobility Command |
| AMEC | Army Management Engineering College |
| AMGS | Automatic Microcode Generation System |
| AMGS | Automatic Microcode Generation System |
| AMPM | AMSAA Maturity Projection Model |
| AMSAA | U.S. Army Materiel System Analysis Activity |
| AMSDL | Acquisition Management Systems and Data Control List |
| AMSDL | Acquisition Management Systems and Data Control List |
| ANOVA | Analysis of Variance |
| ANSI | American National Standards Institute |
| ANSI | American National Standards Institute |
| Ao | Operational Availability |
| AOA | Analysis of Alternatives |
| AP | Array Processor |
| AP | Array Processor |
| APD | Avalanche Photo Diode |
| APD | Avalanche Photo Diode |
| APTE | Automatic Programmed Test Equipment |
| APTE | Automatic Programmed Test Equipment |
| APU | Auxiliary Power Unit |
| APU | Auxiliary Power Unit |
| ARM | Antiradiation Missile |
| ARM | Antiradiation Missile |
| ARP | Armament Recording Program |
| ARW | Airborne Rotary Wing |
| ASA | Advanced Systems Architecture |
| ASA | Advanced Systems Architecture |
| ASA(ALT) | Assistant Secretary of the Army (Acquisition, Technology and Logistics) |
| ASC | Aeronautical Systems Center |
| ASC | Aeronautical Systems Center |
| ASIC | Application Specific Integrated Circuit |
| ASIC | Application Specific Integrated Circuit |
| ASME | American Society of Mechanical Engineers |
| ASQC | American Society of Quality Control |
| AST | Accelerated Stress Testing |
| ASTM | American Society for Testing and Materials |
| ASTM | American Society for Testing and Materials |
| ATC | Air Training Command |
| ATC | Air Training Command |
| ATE | Automatic/Automated Test Equipment |
| ATE | Automatic/Automated Test Equipment |
| ATEC | Army Test and Evaluation Command |
| ATF | Advanced Tactical Fighter |
| ATF | Advanced Tactical Fighter |
| ATG | Automatic Test Generation |
| ATG | Automatic Test Generation |
| ATP | Acceptance Test Procedure |
| ATP | Acceptance Test Procedure |
| ATPG | Automatic Test Pattern Generator |
| ATTD | Advanced Technology Transition Demonstration |
| ATTD | Advanced Technology Transition Demonstration |
| AV SOA | Acquisition Visibility Service Oriented Architecture |
| AVIP | Avionics Integrity Program |
| AVIP | Avionics Integrity Program |
| b | billion |
| b | BIT |
| b | BIT |
| B/S or bps Bits Per Second | |
| BAFO | Best and Final Offer |
| BAFO | Best and Final Offer |
| BB, B/B | Brass Board |
| BB, B/B | Brass Board |
| BCC | Block Check-Sum Character |
| BCC | Block Check-Sum Character |
| BCS | Bench Check Serviceable |
| BCS | Bench Check Serviceable |
| BCWP | Budget Cost of Work Performed |
| BCWP | Budget Cost of Work Performed |
| BCWS | Budget Cost of Work Scheduled |
| BCWS | Budget Cost of Work Scheduled |
| BEA | Budget Estimate Agreement |
| BEA | Budget Estimate Agreement |
| BELL | Bell Labs |
| BES | Budget Estimate Submission |
| BES | Budget Estimate Submission |
| BGA | Ball-Grid Array |
| BIMOS | Bipolar/Metal Oxide Semiconductor |
| BIMOS | Bipolar/Metal Oxide Semiconductor |
| BIST | Built-in Self Test |
| BIST | Built-in Self Test |
| BIT | Built-In Test |
| BIT | Built-In-Test |
| BIT | Built-In-Test |
| BITE | Built-In-Test Equipment |
| BITE | Built-In-Test Equipment |
| BIU | Bus Interface Unit |
| BIU | Bus Interface Unit |
| BJT | Bipolar Junction Transistor |
| BJT | Bipolar Junction Transistor |
| BLER | Block Error Rate |
| BLER | Block Error Rate |
| BMD | Ballistic Missile Defense |
| BPPBS | Biennial Planning, Programming, and Budgeting System |
| BPPBS | Biennial Planning, Programming, and Budgeting System |
| bps, B/S | Bits Per Second |
| C | Centigrade |
| C | Centigrade |
| C3 | Command, Control and Communications |
| C3CM | Command, Control, Communications and Countermeasures |
| C3I | Command, Control, Communications Intelligence |
| C&E | Cause and Effect |
| C-ROM | Control Read Only Memory |
| C-ROM | Control Read Only Memory |
| Cp | Process Capability Index |
| Cpk | Process Performance Index |
| C3 | Command, Control and Communications |
| C3CM | Command, Control, Communications and Countermeasures |
| C3I | Command, Control, Communications Intelligence |
| CA | Corrective Action |
| CA | Contracting Activity |
| CA | Contracting Activity |
| CAD | Computer-Aided Design |
| CAD | Computer Aided Design |
| CAD | Computer Aided Design |
| CADBIT | Computer Aided Design for Built-In Test |
| CADBIT | Computer Aided Design for Built-In Test |
| CAE | Continuous Analog Estimators |
| CAE | Computer Aided Engineering |
| CAE | Computer-Aided Engineering |
| CAE | Computer Aided Engineering |
| CALS | Computer Aided Acquisition Logistics & Support |
| CALS | Continuous Acquisition and Life-Cycle Support |
| CAM | Computer-Aided Manufacturing |
| CAM | Content Addressable Memory |
| CAM | Content Addressable Memory |
| CAP | Corrective Action Period |
| CAS | Column Address Strobe |
| CAS | Column Address Strobe |
| CASE | Computer-Aided Software Engineering |
| CASS | Computer Aided Schematic System |
| CASS | Computer Aided Schematic System |
| CAT | Computer Aided Test |
| CAT | Computer Aided Test |
| CB | Chip Boundary |
| CB | Chip Boundary |
| CBS | Cost Breakdown Structure |
| CCA | Circuit Card Assembly |
| CCB | Configuration Control Board |
| CCB | Capacitive Coupled BIT |
| CCB | Capacitive Coupled Bit |
| CCB | Configuration Control Board |
| CCC | Ceramic Chip Carrier |
| CCC | Ceramic Chip Carrier |
| CCD | Charge Coupled Device |
| CCD | Charged Coupled Device |
| CD | Compact Disc |
| CD-ROM | Compact Disc-Read Only Memory |
| CDD | Capability Development Document |
| CDF | Cumulative Density Function |
| CDF | Cumulative Distribution Function |
| CDF | Cumulative Density Function |
| CDIP | Ceramic Dual In-Line Package |
| CDIP | Ceramic Dual-In-Line Package |
| CDR | Critical Design Review |
| CDR | Critical Design Review |
| CDR | Critical Design Review |
| CDRL | Contract Data Requirements List |
| CDRL | Contract Data Requirements List |
| CE | Concurrent Engineering |
| CEO | Chief Executive Officer |
| CER | Cost Estimating Relationship |
| CFAR | Constant False Alarm Rate |
| CFAR | Constant False Alarm Rate |
| CFE | Contractor Furnished Equipment |
| CFE | Contractor Furnished Equipment |
| CFI | Contractor-Furnished Items |
| CFSR | Contract Fund Status Report |
| CFSR | Contract Fund Status Report |
| CGA | Configurable Gate Array |
| CGA | Configurable Gate Array |
| CI | Configuration Item |
| CI | Configuration Item |
| CI | Confidence Interval |
| CIM | Computer Integrated Manufacturing |
| CIM | Computer Integrated Manufacturing |
| CINC | Commander-In-Chief |
| CINC | Commander-in-Chief |
| CISC | Complex Instruction Set Computer |
| CISC | Complex Instruction Set Computer |
| CIU | Control Interface Unit |
| CIU | Control Interface Unit |
| CLCC | Ceramic Leaded Chip Carrier |
| CLCC | Ceramic Leaded Chip Carrier |
| CLIN | Contract Line Item Number |
| CLIN | Contract Line Item Number |
| CM | Corrective Maintenance |
| CM | Centimeter |
| cm | Centimeter |
| CM | Configuration Manager or Management |
| CM | Corrective Maintenance |
| CM | Configuration Manager or Management |
| CML | Current Mode Logic |
| CML | Current Mode Logic |
| CMM | Capability Maturity Model |
| CMOS | Complementary Metal Oxide Semiconductor |
| CMOS | Complementary Metal Oxide Semiconductor |
| CND | Can Not Duplicate |
| CND | Can Not Duplicate |
| CNI | Communications, Navigation, and Identification |
| CNI | Communications, Navigation and Identification |
| CO | Contracting Officer |
| CO | Contracting Officer |
| CODEC | Coder Decoder |
| CODEC | Coder Decoder |
| COMM | Communications |
| COMM | Communications |
| COMSEC | Communications Security |
| COMSEC | Communications Security |
| COPS | Complex Operations Per Second |
| COPS | Complex Operations Per Second |
| COTS | Commercial Off-The-Shelf |
| COTS | Commercial Off-the-Shelf |
| CPCI | Computer Program Configuration Item |
| CPCI | Computer Program Configuration Item |
| CPFF | Cost-Plus-Fixed-Fee |
| CPFF | Cost-Plus-Fixed-Fee |
| CPIF | Cost-Plus-Incentive-Fee |
| CPIF | Cost-Plus-Incentive-Fee |
| CPM | Control Processor Module |
| CPM | Control Processor Module |
| CPSC | Consumer Product Safety Commission |
| CPU | Central Processing Unit |
| CPU | Central Processing Unit |
| CPU | Central Processing Unit |
| CRC | Cyclic Redundance Check |
| CRC | Cyclic Redundance Check |
| CRTA | Critical Reliability Technology Assessment |
| CS | Chip Select |
| CS | Chip Select |
| CSC | Computer Software Component |
| CSC | Computer Software Component |
| CSC | Computer Software Component |
| CSCI | Computer Software Configuration Item |
| CSCI | Computer Software Configuration Item |
| CSCI | Computer Software Configuration Item |
| CSDR | Cost and Software Data Reporting |
| CSP | Common Signal Processor |
| CSP | Common Signal Processor |
| CSR | Control Status Register |
| CSR | Control Status Register |
| CSU | Computer Software Unit |
| CTE | Coefficient of Thermal Expansion |
| CTE | Coefficient of Thermal Expansion |
| CTE | Coefficient of Thermal Expansion |
| CTR | Current Transfer Ratio |
| CTR | Current Transfer Ratio |
| CUSUM | Cumulative Sum |
| CV | Capacitance-Voltage |
| CV | Capacitance-Voltage |
| D Level | Depot Level |
| D-Level | Depot Level |
| D/A | Digital-to-Analog |
| D/A | Digital-to-Analog |
| DAB | Defense Acquisition Board |
| DAB | Defense Acquisition Board |
| DAG | Defense Acquisition Guidebook |
| DAMIR | Defense Acquisition Management Information Retrieval |
| dB | Decibel |
| dB | Decibel |
| DC | Duty Cycle |
| dc | Direct Current |
| dc | Direct Current |
| DC | Duty Cycle |
| DECTED | Double Error Correcting, Triple Error Detecting |
| DECTED | Double Error Correcting, Triple Error Detecting |
| DED | Double Error Detection |
| DED | Double Error Detection |
| DEM/VAL | Demonstration and Validation |
| DEM/VAL | Demonstration and Validation |
| DESC | Defense Electronics Supply Center |
| DESC | Defense Electronics Supply Center |
| df | Degrees of Freedom |
| DF | Dissipation Factor |
| DFARS | Defense Federal Acquisition Regulations |
| dferr | Degrees of Freedom for the Error |
| dfF | Degrees of Freedom for a Factor |
| DFM | Design for Manufacturing |
| DFMEA | Design Failure Modes and Effects Analysis |
| DFR | Design for Reliability |
| DID | Data Item Description |
| DID | Data Item Description |
| DID | Data Item Description |
| DIP | Dual In-line Package |
| DIP | Dual In-Line Package |
| DIP | Dual In-Line Package |
| DISC | Defense Industrial Supply Center |
| DISC | Defense Industrial Supply Center |
| DLA | Defense Logistics Agency |
| DLA | Defense Logistics Agency |
| DMR | Defense Management Review |
| DMR | Defense Management Review |
| DoD | Department of Defense |
| DoD | U.S. Department of Defense |
| DOD | Department of Defense |
| DoD | Department of Defense |
| DoD-ADL | Department of Defense Authorized Data List |
| DoD-ADL | Department of Defense Authorized Data List |
| DODI | Department of Defense Instruction |
| DOE | Design of Experiments |
| DOE | Design of Experiments |
| DOE | Design of Experiments |
| DOS | Disk Operating System |
| DOS | Disk Operating System |
| DP | Data Processor |
| DP | Data Processor |
| DPA | Destructive Physical Analysis |
| DPA | Destructive Physical Analysis |
| DPM | AMSAA Discrete Projection Model |
| DR | Damage Ratio |
| DR | Design Review |
| DR | Discrimination Ratio |
| DRAM | Dynamic Random Access Memory |
| DRAM | Dynamic Random Access Memory |
| DRS | Deficiency Reporting System |
| DRS | Deficiency Reporting System |
| DSP | Digital Signal Processing |
| DSP | Digital Signal Processing |
| DT&E | Development Test & Evaluation |
| DT&E | Developmental Test and Evaluation |
| DT&E | Development Test and Evaluation |
| DTIC | Defense Technical Information Center |
| DTIC | Defense Technical Information Center |
| DTM | Defense Technical Memorandum |
| DUT | Device Under Test |
| DUT | Device Under Test |
| Ea | Activation Energy in Electron Volts |
| Ea | Activation Energy in Electron Volts |
| EAROM | Electrically Alterable Read Only Memory |
| EAROM | Electrically Alterable Read Only Memory |
| ECC | Error Checking and Correction |
| ECC | Error Checking and Correction |
| ECCM | Electronic Counter Countermeasures |
| ECCM | Electronic Counter Countermeasures |
| ECF | Effective Cumulative Failures |
| ECL | Emitter Coupled Logic |
| ECL | Emitter Coupled Logic |
| ECM | Electronic Countermeasures |
| ECM | Electronic Countermeasures |
| ECP | Engineering Change Proposal |
| ECP | Engineering Change Proposal |
| ECP | Engineering Change Proposal |
| ECS | Environmental Control System |
| ECU | Environmental Control Unit |
| ECU | Environmental Control Unit |
| EDA | Electronic Design Automation |
| EDA | Electronic Design Automation |
| EDAC | Error Detection and Correction |
| EDAC | Error Detection and Correction |
| EDAX | Energy Dispersive Analysis by X-Ray |
| EDM | Engineering Development Model |
| EDM | Engineering Development Model |
| EEC | European Economic Community |
| EEPROM | Electrically Erasable Programmable Read Only Memory |
| EEPROM | Electrically Erasable Programmable Read Only Memory |
| EGC | Electronic Gate Count |
| EGC | Electronic Gate Count |
| EGS | Electronic Ground System |
| EGS | Electronic Ground System |
| EGSE | Electronic Ground Support Equipment |
| EGSE | Electronic Ground Support Equipment |
| EIA | Electronics Industries Association |
| EM | Electromagnetic |
| EM | Electromigration |
| EM | Electromigration |
| EMC | Electromagnetic Compatibility |
| EMC | Electromagnetic Compatibility |
| EMD | Engineering and Manufacturing Development |
| EMD | Engineering and Manufacturing Development |
| EMD | Engineering and Management Development |
| EMI | Electromagnetic Interface |
| EMI | Electromagnetic Interference |
| EMI | Electromagnetic Interference |
| EMP | Electromagnetic Pulse |
| EMP | Electronic Magnetic Pulse |
| EO | Electro-optical |
| EO | Electro-Optical |
| EOS | Electrical Overstress |
| EOS | Electrical Overstress |
| Eox | Electronic Field Strength in Oxide |
| Eox | Electronic Field Strength in Oxide |
| EP | Electrical Parameter |
| EP | Electrical Parameter |
| EPA | Environmental Protection Agency |
| EPC | Engineering Process Control |
| EPRD | Electronic Parts Reliability Databook |
| EPRI | Electronic Power Research Institute |
| EPROM | Erasable Programmable Read Only Memory |
| EPROM | Erasable Programmable Read Only Memory |
| ER | Established Reliability |
| ER Part | Established Reliability Part |
| ERC | Electrical Rule Check |
| ERC | Electrical Rule Check |
| ESC | Electronic System Center |
| ESC | Electronic System Center |
| ESD | Electrostatic Discharge |
| ESD | Electrostatic Discharge |
| ESM | Electronics Support Measure |
| ESM | Electronics Support Measure |
| ESR | Equivalent Series Resistance |
| ESS | Environmental Stress Screening |
| ESS | Environmental Stress Screening |
| ESS | Environmental Stress Screening |
| ETE | Electronic or External Test Equipment |
| ETE | Electronic or External Test Equipment |
| eV | Electron Volt |
| eV | Electron Volt |
| EVA | Extreme Value Analysis |
| EW | Electronic Warfare |
| EW | Electronic Warfare |
| EWMA | Exponentially-Weighted Moving Average |
| EXP | Exponent |
| EXP | Exponent |
| F | F-Ratio Statistic |
| F/W | Firmware |
| F/W | Firmware |
| FA | False Alarm |
| FA | False Alarm |
| FAA | Federal Aviation Administration |
| FAB | Fabrication |
| FAB | Fabrication |
| FAR | Federal Acquisition Regulation |
| FAR | False Alarm Rate |
| FAR | False Alarm Rate |
| FAR | Federal Acquisition Regulation |
| FARR | Forward Area Alerting Radar Receiver |
| FARR | Forward Area Alerting Radar Receiver |
| FAT | First Article Testing |
| FAT | First Article Testing |
| FBT | Functional Board Test |
| FBT | Functional Board Test |
| FCA | Functional Configuration Audit |
| FCA | Functional Configuration Audit |
| FD | Fault Detection |
| FD | Fault Detection |
| FD | Fault Detection |
| FD/SC | Failure Definition/Scoring Criteria |
| FDI | Fault Detection and Isolation |
| FDI | Fault Detection and Isolation |
| FEA | Finite Element Analysis |
| FEA | Finite Element Analysis |
| FEF | Fix Effectiveness Factor |
| FEM | Finite Element Model |
| FET | Field Effect Transistor |
| FET | Field Effect Transistor |
| FFD | Fraction of Faults Detected |
| FFD | Fraction of Faults Detected |
| FFI | Fraction of Faults Isolated |
| FFI | Fraction of Faults Isolated |
| FFP | Firm Fixed Price |
| FFP | Firm Fixed Price |
| FFRP | Field Failure Return Program |
| FFT | Fast Fourier Transform |
| FFT | Fast Fourier Transform |
| FFTAU | Fast Fourier Transform Arithmetic Unit |
| FFTAU | Fast Fourier Transform Arithmetic Unit |
| FFTCU | Fast Fourier Transform Control Unit |
| FFTCU | Fast Fourier Transform Control Unit |
| FH | Flight Hours |
| FHA | Fault Hazard Analysis |
| FI | Fault Isolation |
| FI | Fault Isolation |
| FI | Fault Isolation |
| FIFO | First In First Out |
| FIFO | First In First Out |
| FILO | First In Last Out |
| FILO | First In Last Out |
| FIR | Fault Isolation Resolution |
| FIR | Fault Isolation Resolution |
| FIT | Fault Isolation Test |
| FIT | Fault Isolation Test |
| FITS | Failures Per 109 hours |
| FITS | Failure Per 109 Hours |
| FLIR | Forward Looking Infrared |
| FLIR | Forward Looking Infrared |
| FLOPS | Floating Point Operations Per Second |
| FLOTOX | Floating Gate Tunnel-Oxide |
| FLOTOX | Floating Gate Tunnel - Oxide |
| FM | Failure Mode |
| FMC | Full Mission Capability |
| FMC | Full Mission Capability |
| FMEA | Failure Modes and Effects Analysis |
| FMEA | Failure Modes and Effects Analysis |
| FMEA | Failure Modes and Effects Analysis |
| FMECA | Failure Modes, Effects and Criticality Analysis |
| FMECA | Failure Modes, Effects and Criticality Analysis |
| FMECA | Failure Modes, Effects and Criticality Analysis |
| FOC | Full Operational Capability |
| FOM | Figure of Merit |
| FOM | Figure of Merit |
| FOV | Field of View |
| FOV | Field of View |
| FP | Floating Point |
| FP | Floating Point |
| FPA | Focal Plane Array |
| FPA | Focal Plane Array |
| FPAP | Floating Point Array Processor |
| FPAP | Floating Point Array Processor |
| FPLA | Field Programmable Logic Array |
| FPLA | Field Programmable Logic Array |
| FPMFH | Failure Per Million Flight Hours |
| FPMFH | Failures Per Million Flight Hours |
| FPMH | Failures Per Million Hours |
| FPMH | Failures Per Million Hours |
| FPPE | Floating Point Processing Element |
| FPPE | Floating Point Processing Element |
| FPRB | Failure Prevention Review Board |
| FQR | Formal Qualification Review |
| FQR | Formal Qualification Review |
| FQT | Final Qualification Test |
| FQT | Final Qualification Test |
| FR | Failure Rate |
| FR | Failure Rate |
| FRACAS | Failure Reporting and Corrective Action System |
| FRACAS | Failure Reporting and Corrective Action System |
| FRACAS | Failure Reporting, Analysis and Corrective Action System |
| FRB | Failure Review Board |
| FRB | Failure Review Board |
| FRB | Failure Review Board |
| FRP | Full Rate Production |
| FS | Full Scale |
| FS | Full Scale |
| FSC | Federal Stock Class or Federal Supply Classification |
| FSD | Full Scale Development |
| FSD | Full Scale Development |
| FSED | Full Scale Engineering Development |
| FSED | Full Scale Engineering Development |
| FT | Fourier Transform |
| FT | Fourier Transform |
| FTA | Fault Tree Analysis |
| FTA | Fault Tree Analysis |
| ftp | File Transfer Protocol |
| FTTL | Fast Transistor-Transistor Logic |
| FTTL | Fast Transistor - Transistor Logic |
| FY | Fiscal Year |
| FY | Fiscal Year |
| GaAs | Gallium Arsenide |
| GaAs | Gallium Arsenide |
| GAO | General Accounting Office |
| GAO | General Accounting Office |
| GB | Gigabyte |
| GB | Ground Benign |
| GD | Global Defect |
| GD | Global Defect |
| GEIA | Government Electronics & Information Technology Association (now TechAmerica) |
| GF | Ground Fixed |
| GFE | Government Furnished Equipment |
| GFE | Government Furnished Equipment |
| GFP | Government Furnished Property |
| GFP | Government Furnished Property |
| GHz | Gigahertz |
| GIDEP | Government Industry Data Exchange Program |
| GIDEP | Government Industry Data Exchange Program |
| GIMADS | Generic Integrated Maintenance Diagnostic |
| GM | Ground Mobile |
| GM | Global Memory |
| GM | Global Memory |
| GOCO | Government Owned Contractor Operated |
| GOCO | Government Owned Contractor Operated |
| GOF | Goodness-of-Fit |
| GOMAC | Government Microcircuit Applications Conference |
| GOMAC | Government Microcircuit Applications Conference |
| GP | Growth Potential |
| GSE | Ground Support Equipment |
| GSE | Ground Support Equipment |
| GSPA | Generic Signal Processor Architecture |
| GSPA | Generic Signal Processor Architecture |
| H/W | Hardware |
| H/W | Hardware |
| HALT | Highly Accelerated Life Test |
| HALT | Highly Accelerated Life Testing |
| HASS | Highly Accelerated Stress Screening |
| HAST | Highly Accelerated Stress Testing |
| HAST | Highly Accelerated Stress Test |
| HDBK | Handbook |
| HDL | Hardware Description Language |
| HDL | Hardware Description Language |
| HDS | Hierarchical Design System |
| HDS | Hierarchical Design System |
| HEMT | High Electron Mobility Transistor |
| HEMT | High Electron Mobility Transistor |
| HFE | Gain |
| HFTA | Hardware Fault Tree Analysis |
| HFTA | Hardware Fault Tree Analysis |
| HHDL | Hierarchical Hardware Description Language |
| HHDL | Hierarchical Hardware Description Language |
| HMOS | High Performance Metal Oxide Semiconductor |
| HMOS | High Performance Metal Oxide Semiconductor |
| HOL | Higher Order Language |
| HOL | Higher Order Language |
| HPP | Homogeneous Poisson Process |
| HPP | Homogeneous Poisson Process |
| HSI | Human Systems Integration |
| html | HyperText Markup Language |
| http | HyperText Transmission Protocol |
| HWCI | Hardware Configuration Item |
| HWCI | Hardware Configuration Item |
| Hz | Hertz |
| Hz | Hertz |
| I | Current |
| I | Current |
| I Level | Intermediate Level |
| I-Level | Intermediate Level |
| I/O | Input/Output |
| I/O | Input/Output |
| IAC | Information Analysis Center |
| IAC | Information Analysis Center |
| IAW | In Accordance With |
| IAW | In Accordance With |
| IC | Integrated Circuit |
| IC | Integrated Circuit |
| ICBO | Collector-Base Output Current |
| ICD | Interface Control Document |
| ICD | Interface Control Document |
| ICNIA | Integrated Communications, Navigation and Identification Avionics |
| ICT | In Circuit Testing |
| ICT | In Circuit Testing |
| ICWG | Interface Control Working Group |
| ICWG | Interface Control Working Group |
| Id | Drain Current |
| ID | Integrated Diagnostics |
| Id | Drain Current |
| ID | Integrated Diagnostics |
| IDAS | Integrated Design Automation System |
| IDAS | Integrated Design Automation System |
| IDHS | Intelligence Data Handling System |
| IDHS | Intelligence Data Handling System |
| IEC | International Electrotechnical Commission |
| IEEE | Institute of Electrical and Electronic Engineers |
| IEEE | Institute of Electrical and Electronics Engineers |
| IEEE | Institute of Electrical and Electronic Engineers |
| IEST | Institute of Environmental Sciencies and Technology |
| IEST | Institute of Environmental Sciences and Technology |
| IF | Interface |
| IF | Interface |
| IFB | Invitation for Bid |
| IFB | Invitation for Bid |
| IFF | Identification Friend or Foe |
| IFF | Identification Friend or Foe |
| IFFT | Inverse Fast Fourier Transform |
| IFFT | Inverse Fast Fourier Transform |
| IG | Inspector General |
| IG | Inspector General |
| IGC | Idealized Growth Curve |
| ILD | Injection Laser Diode |
| ILD | Injection Laser Diode |
| ILS | Integrated Logistics Support |
| ILS | Integrated Logistics Support |
| ILSM | Integrated Logistics Support Manager |
| ILSM | Integrated Logistics Support Manager |
| IMPATT | Impact Avalanche and Transit Time |
| IMPATT | Impact Avalanche and Transit Time |
| INEWS | Integrated Electronic Warfare System |
| INEWS | Integrated Electronic Warfare System |
| IOC | Initial Operational Capability |
| IOC | Initial Operational Capability |
| IOC | Initial Operational Capability |
| IOT | Initial Operational Test |
| IOT&E | Initial Operational Test & Evaluation |
| IOT&E | Initial Operational Test & Evaluation |
| IOT&E | Initial Operational Test & Evaluation |
| IPD | Integrated Product Development |
| IPOUND | Intermittent; Partial; Over; Unintended; Negative; Degraded |
| IPT | Integrated Product Team |
| IR | Reverse Current |
| IR&D | Independent Research & Development |
| IR&D | Independent Research & Development |
| IRPS | International Reliability Physics Symposium |
| IRPS | International Reliability Physics Symposium |
| IRPS | International Reliability Physics Symposium |
| ISA | Instruction Set Architecture |
| ISA | Instruction Set Architecture |
| ISO | International Standards Organization |
| ISPS | Instruction Set Processor Specification |
| ISPS | Instruction Set Processor Specification |
| Isub | Substrate Current |
| Isub | Substrate Current |
| ITAR | International Traffic in Arms Regulation |
| ITAR | International Traffic In Arms Regulation |
| ITM | Integrated Test and Maintenance |
| ITM | Integrated Test and Maintenance |
| IWSM | Integrated Weapons Systems Management |
| IWSM | Integrated Weapons System Management |
| J | Current Density |
| J | Current Density |
| JAN | Joint Army Navy |
| JAN | Joint Army Navy |
| JCIDS | Joint Capabilities Integration Development System |
| JCS | Joint Chiefs of Staff |
| JCS | Joint Chiefs of Staff |
| JEDEC | Joint Electron Device Engineering Council |
| JEDEC | Joint Electron Device Engineering Council |
| JFET | Junction Field Effect Transistor |
| JFET | Junction Field Effect Transistor |
| JIPM | Japanese Institute of Plant Maintenance |
| JSC | Johnson Space Center |
| JTAG | Joint Test Action Group |
| JTAG | Joint Test Action Group |
| k | Boltzman''s Constant (8' + frmMain.DecimalSeparator + '65 x 10-5 electron volts/°Kelvin) |
| K | Thousand |
| K | Thousand |
| k | Boltzmans Constant (8.65 x 10-5 electron volts/°Kelvin |
| K | Kelvin |
| KHB | Kennedy Handbook |
| KOPS | Thousands of Operations per Second |
| KOPS | Thousands of Operations Per Second |
| KPIV | Key Process Input Variable |
| KPOV | Key Process Output Variable |
| LAN | Local Area Network |
| LAN | Local Area Network |
| LCB | Lower Confidence Bound |
| LCC | Leadless Chip Carrier |
| LCC | Life Cycle Cost |
| LCC | Leadless Chip Carrier |
| LCC | Life Cycle Cost |
| LCC | Life Cycle Cost |
| LCCA | Life Cycle Cost Analysis |
| LCCC | Leadless Ceramic Chip Carrier |
| LCCC | Leadless Ceramic Chip Carrier |
| LCL | Lower Confidence Limit |
| LCL | Lower Confidence Limit |
| LCSP | Life-Cycle Sustainment Plan |
| LED | Light Emitting Dioide |
| LED | Light Emitting Diode |
| LEX | Life Extension |
| LFR | Launch and Flight Reliability |
| LFR | Launch and Flight Reliability |
| LHR | Low Hop Rate |
| LHR | Low Hop Rate |
| LIF | Low Insertion Force |
| LIF | Low Insertion Force |
| LIFO | Last In First Out |
| LIFO | Last In First Out |
| LISP | List Processing |
| LISP | List Processing |
| LOC | Lines of Code |
| LRIP | Low Rate Initial Production |
| LRM | Line Replaceable Module |
| LRM | Line Replaceable Module |
| LRU | Line Replaceable Unit |
| LRU | Line Replaceable Unit |
| LS | Least Squares |
| LSA | Logistics Support Analysis |
| LSA | Logistics Support Analysis |
| LSAR | Logistics Support Analysis Record |
| LSAR | Logistics Support Analysis Record |
| LSB | Least Significant Bit |
| LSB | Least Significant Bit |
| LSE | Lead System Engineer |
| LSE | Lead System Engineer |
| LSI | Large Scale Integration |
| LSI | Large Scale Integration |
| LSL | Lower Specification Limit |
| LSL | Lower Specification Limit |
| LSSD | Level Sensitive Scan Design |
| LSSD | Level Sensitive Scan Design |
| LSTTL | Low Power Schottky Transistor-Transistor Logic |
| LSTTL | Low Power Schottky Transistor Transistor Logic |
| LUT | Look Up Table |
| LUT | Look Up Table |
| M | Maintainability |
| m | Million |
| m | million |
| M | Maintainability |
| M&S | Modeling & Simulation |
| M-Demo | Maintainability Demonstration |
| M-MM | Mean Maintenance Manhours |
| M-MM | Mean Maintenance Manhours |
| Mct | Mean Corrective Maintenance Time |
| mA | Milliampere |
| mA | Milliampere |
| MAC | Multiplier Accumulator Chip |
| MAC | Multiplier Accumulator Chip |
| MAJCOM | Major Command |
| MAJCOM | Major Command |
| MAP | Modular Avionics Package |
| MAP | Modular Avionics Package |
| MB | Megabyte |
| Mb | Megabit |
| MBPS | Million Bits Per Second |
| MBPS | Million Bits Per Second |
| MCA | Monte Carlo Analysis |
| MCCR | Mission Critical Computer Resources |
| MCCR | Mission Critical Computer Resources |
| MCFOS | Military Computer Family Operating System |
| MCFOS | Military Computer Family Operating System |
| MCM | Multichip Module |
| MCOPS | Million Complex Operations Per Second |
| MCOPS | Million Complex Operations Per Second |
| Mct | Mean Corrective Maintenance Time |
| MCTL | Military Critical Technology List |
| MCTL | Military Critical Technology List |
| MCU | Microcontrol Unit |
| MCU | Microcontrol Unit |
| MD | Maintainability Demonstration |
| MDA | Milestone Decision Authority |
| MDAP | Major Defense Acquisition Program |
| MDCS | Maintenance Data Collection System |
| MDCS | Maintenance Data Collection System |
| MDM | Multiplexer/Demultiplexer |
| MDM | Multiplexer/Demultiplexer |
| MDR | Microcircuit Device Reliability |
| MDR | Microcircuit Device Reliability |
| MDS | Mission/Design/Series |
| MDT | Mean Down Time |
| MDT | Mean Downtime |
| MDT | Mean Downtime |
| MELF | Metal Electrode Face |
| MELF | Metal Electrode Face |
| MENS | Mission Equipment Needs Statement |
| MENS | Mission Element Needs Statement |
| MENS | Mission Element Needs Statement |
| MENS | Mission Equipment Needs Statement |
| MESL | Mission-Essential Systems (or Subsystems) List |
| MFHBF | Mean Flying Hours Between Failure |
| MFHBMCF | Mean Flying Hours Between Mission Critical Failures |
| MFHBUMA | Mean Flying Hours Between Unscheduled Maintenance Actions |
| MFLOPS | Million Floating Point Operations Per Second |
| MFLOPS | Million Floating Point Operations Per Second |
| MFPT | Machinery Failure Prevention Technology |
| MHz | Megahertz |
| Mhz | Megahertz |
| MICAP | Mission Capability |
| Mil | 1/1000th of an Inch |
| Mil | 1000th of an Inch |
| MIL | Military |
| MIL-HDBK | U.S. DoD Military Handbook |
| MIL-STD | U.S. DoD Military Standard |
| MIL-STD | Military Standard |
| MIL-STD | Military Standard |
| MIMIC | Microwave Millimeter Wave Monolithic Integrated Circuit |
| MIMIC | Microwave Millimeter Wave Monolithic Integrated Circuit |
| MIN | Maintenance Interface Network |
| MIN | Maintenance Interface Network |
| MIPS | Million Instructions Per Second |
| MIPS | Million Instructions Per Second |
| MISD | Multiple Instructions Single Data |
| MISD | Multiple Instructions Single Data |
| ML | Maximum Likelihood |
| MLB | Multilayer Board |
| MLB | Multilayer Board |
| MLE | Maximum Likelihood Estimate |
| MLH/OH | Maintenance Labor Hour per Operating Hour |
| MLIPS | Million Logic Inferences/Instructions Per Second |
| MLIPS | Million Logic Inferences/Instructions Per Second |
| mm | Millimeter |
| mm | Millimeter |
| MMBF | Mean Miles Between Failure |
| MMBF | Mean Miles Between Failure |
| MMBF | Mean Miles Between Failure |
| MMD | Mean Mission Duration |
| MMD | Mean Mission Duration |
| MMH/FH | Maintenance Manhours Per Flight Hour |
| MMH/FH | Maintenance Manhours Per Flight Hour |
| MMH/PH | Maintenance Manhours Per Possessed Hour |
| MMH/PH | Mean Manhours Per Possessed Hour |
| MMIC | Monolithic Microwave Integrated Circuit |
| MMIC | Monolithic Microwave Integrated Circuit |
| MMM | Mass Memory Module |
| MMM | Mass Memory Module |
| MMPS | Million Multiples Per Second |
| MMPS | Million Multiples Per Second |
| MMR | Multimode Radar |
| MMR | Multimode Radar |
| MMS | Mass Memory Superchip |
| MMS | Mass Memory Superchip |
| MMW | Millimeter Wave |
| MMW | Millimeter Wave |
| MN | Maintenance Node |
| MN | Maintenance Node |
| MNN | Maintenance Network Node |
| MNN | Maintenance Network Node |
| MNS | Mission Need Statement |
| MNS | Mission Need Statement |
| MOA | Memorandum of Agreement |
| MOA | Memorandum of Agreement |
| MODEM | Modulator Demodulator |
| MODEM | Modulator Demodulator |
| MOPS | Million Operations Per Second |
| MOPS | Million Operations Per Second |
| MOS | Metal Oxide Semiconductor |
| MOS | Metal Oxide Semiconductor |
| MOSFET | Metal Oxide Semiconductor Field Effect Transistor |
| MOSFET | Metal Oxide Semiconductor Field Effect Transistor |
| MP | Maintenance Processor |
| MP | Maintenance Processor |
| MPCAG | Military Parts Control Advisory Group |
| MPCAG | Military Parts Control Advisory Group |
| MPMT | Mean Preventive Maintenance Time |
| MRAP | Microcircuit Reliability Assessment Program |
| MS | Management Strategy |
| ms | Millisecond |
| ms | Millisecond |
| MS | Milestone |
| MSA | Measurement Systems Analysis |
| MSB | Most Significant Bit |
| MSB | Most Significant Bit |
| MSI | Medium Scale Integration |
| MSI | Medium Scale Integration |
| MTBCF | Mean Time Between Critical Failures |
| MTBCF | Mean-Time-Between-Critical- Failure |
| MTBD | Mean-Time-Between-Demand |
| MTBD | Mean Time Between Demand |
| MTBDE | Mean Time Between Downing Events |
| MTBDE | Mean-Time-Between-Downing- Events |
| MTBF | Mean Time Between Failure |
| MTBF | Mean Time Between Failure |
| MTBF | Mean-Time-Between-Failure |
| MTBFF | Mean-Time-Between-Failure (Field)MTBFF |
| MTBFF | Mean Time Between Functional Failure |
| MTBM-IND | Mean-Time-Between- Maintenance-Induced (Type 2 Failure) |
| MTBM-IND Mean Time Between Maintenance-Induced (Type 2 Failure) | |
| MTBM-INH | Mean-Time-Between-Maintenance-Inherent (Type 1 Failure) |
| MTBM-INH Mean Time Between Maintenance-Inherent (Type 1 Failure) | |
| MTBM-ND | Mean-Time-Between- Maintenance-No Defect (Type 6 Failure) |
| MTBM-ND | Mean Time Between Maintenance-No Defect (Type 6 failure) |
| MTBM-P | Mean-Time-Between- Maintenance-Preventive |
| MTBM-P | Mean Time Between Maintenance-Preventive |
| MTBM-TOT | Mean-Time-Between- Maintenance-Total |
| MTBM-TOT Mean Time Between Maintenance-Total | |
| MTBMA | Mean-Time-Between- Maintenance-Actions |
| MTBMA | Mean Time Between Maintenance Actions |
| MTBMF | Mean-Time-Between- Maintenance (Field) |
| MTBR | Mean Time Between Removals |
| MTBR | Mean-Time-Between- Removals |
| MTBRF | Mean-Time-Between- Removals (Field) |
| MTBUMA | Mean-Time-Between- Unscheduled-Maintenance- Actions |
| MTBUMA | Mean Time Between Unscheduled Maintenance Actions |
| MTE | Multipurpose Test Equipment |
| MTE | Minimal Test Equipment |
| MTE | Multipurpose Test Equipment |
| MTE | Minimal-Test-Equipment |
| MTI | Moving Target Indicator |
| MTI | Moving Target Indicator |
| MTTE | Mean Time to Error |
| MTTE | Mean-Time-To-Error |
| MTTF | Mean Time To Failure |
| MTTF | Mean Time to Failure |
| MTTF | Mean-Time-To-Failure |
| MTTR | Mean-Time-To-Repair |
| MTTRS | Mean-Time-To-Restore- System |
| MUX | Multiplexer |
| MUX | Multiplexer |
| MV | Mega Volt (Million Volt) |
| MV | Mega Volt (Million Volt) |
| MVF | Mean Value Function |
| mW | Milliwatt |
| mW | Milliwatt |
| MWPS | Million Words Per Second |
| MWPS | Million Words Per Second |
| NASA | National Aeronautics and Space Administration |
| NAVAIR | Naval Air Systems Command |
| NCSA | National Center for Supercomputing Applications |
| NDI | Nondevelopmental Items |
| NDI | Nondevelopmental Item |
| NDI | Nondevelopmental Items |
| NDT | Nondestructive Testing |
| NDT | Nondestructive Testing |
| NHB | NASA Handbook |
| NHPP | Nonhomogeneous Poisson Process |
| NHPP | Non-Homogeneous Poisson Process |
| NIST | National Institute of Standards and Technology |
| NMOS | N-Channel Metal Oxide Semiconductor |
| NMOS | N-Channel Metal Oxide Semiconductor |
| NPRD | Nonelectronic Parts Reliability Data |
| NPRD | Nonelectronic Parts Reliability Databook |
| ns | Nanosecond |
| ns | Nanosecond |
| NS | Naval Sheltered |
| NU | Naval Unsheltered |
| NWSC | Naval Warfare Surface Center |
| O&M | Operation and Maintenance |
| O&M | Operation and Maintenance (synonymous with O&S) |
| O&M | Operation and Maintenance |
| O&S | Operation and Support |
| O&S | Operation and Support |
| O-Level | Organizational Level |
| O-Level | Organizational Level |
| OC | Operating Characteristic |
| ODC | Orthogonal Defect Classification |
| OEM | Original Equipment Manufacturer |
| OEM | Original Equipment Manufacturer |
| OMB | Office of Management and Budget |
| OMB | Office of Management and Budget |
| OMS/MP | Operations Mode Summary/Mission Profile |
| OPEVAL | Operational Evaluation |
| OPR | Office of Primary Responsibility |
| OPR | Office of Primary Responsibility |
| OPS | Operations Per Second |
| OPS | Operations Per Second |
| OPTEVFOR | Operational Test and Evaluation Force |
| ORD | Operational Requirements Document |
| ORD | Operational Requirements Document |
| OROM | Optical Read Only Memory |
| OROM | Optical Read Only Memory |
| OS | Operating System |
| OSD | Office of the Secretary of Defense |
| OSD | Office of the Secretary of Defense |
| OSD | Office of the Secretary of Defense |
| OSS | Open-Source Software |
| OT&E | Operational Test & Evaluation |
| OT&E | Operational Test and Evaluation |
| OTS | Off-The-Shelf |
| OTS | Off-The-Shelf |
| OUSD(AT&L) | Office of the Under Secretary of Defense for Acquisition, Technology and Logistics |
| P | Power |
| P | Percentile |
| p | Probability |
| P | Power |
| PACAF | Pacific Air Forces |
| PAL | Programmable Array Logic |
| PAL | Programmable Array Logic |
| PAT | Programmable Alarm Thresholds |
| PAT | Process Action Team |
| PAT | Process Action Team |
| PAT | Programmable Alarm Thresholds |
| PBL | Performance-Based Logistics or Performance-Based Life-Cycle Support |
| PC | Printed Circuit |
| PC | Printed Circuit |
| PCA | Physical Configuration Audit |
| PCA | Physical Configuration Audit |
| PCB | Printed Circuit Board |
| PCB | Printed Circuit Board |
| PCO | Procuring Contracting Officer |
| PCO | Procuring Contracting Officer |
| Pd | Power Dissipation |
| PD | Power Dissipation |
| pdf | Probability Distribution Function |
| PDF | Probability Density Function |
| PDF | Probability Density Function |
| PDL | Program Design Language |
| PDL | Program Design Language |
| PDR | Preliminary Design Review |
| PDR | Preliminary Design Review |
| PDR | Preliminary Design Review |
| PEM | Plastic Encapsulated Microcircuit |
| PEM | Program Element Monitor |
| PFMEA | Process Failure Modes and Effects Analysis |
| PGA | Pin Grid Array |
| PGA | Pin Grid Array |
| PGC | Planned Growth Curve |
| PHA | Preliminary Hazard Analysis |
| PIN | Positive Intrinsic Negative |
| PIN | Positive Intrinsic Negative |
| PLA | Programmable Logic Array |
| PLA | Programmable Logic Array |
| PLCC | Plastic Leadless Chip Carrier |
| PLCC | Plastic Leadless Chip Carrier |
| PLD | Programmable Logic Device |
| PLD | Programmable Logic Device |
| PM | Preventive Maintenance |
| PM | Program Manager |
| PM | Preventive Maintenance |
| PM | Program Manager |
| PM | Program Manager |
| PM2 | AMSAA Projection Methodology - Continuous |
| PM2-Discrete | AMSAA Projection Methodology - Discrete |
| PMD | Program Management Directive |
| PMD | Program Management Directive |
| PMOS | P-Channel Metal Oxide Semiconductor |
| PMOS | P-Channel Metal Oxide Semiconductor |
| PMP | Parts, Materials and Processes |
| PMP | Parts, Materials and Processes |
| PMP | Program Management Plan |
| PMP | Program Management Plan |
| PMR | Program Management Review |
| PMR | Program Management Review |
| PMRT | Program Management Responsibility Transfer |
| PMRT | Program Management Responsibility Transfer |
| PO | Program Office |
| PO | Program Office |
| PoF | Physics-of-Failure |
| Poly | Polycrystalline Silicon |
| Poly | Polycrystalline Silicon |
| PPM | Parts Per Million |
| PPM | Parts Per Million |
| ppm | Parts per Million |
| PPSL | Preferred Parts Selection List |
| PPSL | Preferred Parts Selection List |
| PR | Process-Related |
| PRAT | Production Reliability Acceptance Test |
| PRAT | Production Reliability Acceptance Test |
| PROM | Programmable Read Only Memory |
| PROM | Programmable Read Only Memory |
| PRR | Production Readiness Review |
| PRR | Production Readiness Review |
| PRST | Probability Ratio Sequential Test |
| PRST | Probability Ratio Sequential Test |
| PS | Power Supply |
| PS | Power Supply |
| PSAC | Parts Selection, Application and Control |
| PSC | Preferred Screening Condition |
| PSR | Program Support Review |
| PTH | Plated-Through Hole |
| PTH | Plated Through Hole |
| PTH | Plated Through Hole |
| PtSi | Platinum Silicide |
| PtSi | Platinum Silicide |
| PV | Present Value |
| PW | Pulse Width |
| PW | Pulse Width |
| PWB | Printed Wiring Board |
| PWB | Printed Wiring Board |
| PWB | Printed Wiring Board |
| QA | Quality Assurance |
| QA | Quality Assurance |
| QA | Quality Assurance |
| QC | Quality Control |
| QC | Quality Control |
| QDR | Quality Deficiency Report |
| QDR | Quality Deficiency Report |
| QFD | Quality Function Deployment |
| QFD | Quality Function Deployment |
| QML | Qualified Manufacturers List |
| QML | Qualified Manufacturers List |
| QPL | Qualified Parts List |
| QPL | Qualified Parts List |
| QRAT | Quick Reliability Assessment ToolQT&E |
| QSI | Quanterion Solutions Incorporated |
| QT&E | Qualification Test and Evaluation |
| QUMR | Quality Unsatisfactory Material Report |
| QUMR | Quality Unsatisfactory Material Report |
| R | Reliability |
| R | Reliability |
| R&D | Research and Development |
| R&D | Research and Development |
| R&M | Reliability and Maintainability |
| R&M | Reliability and Maintainability |
| R&M | Reliability & Maintainability |
| RAC | Reliability Analysis Center |
| RAD | Radiation |
| RAD | Radiation |
| RADC | Rome Air Development Center |
| RADC | Rome Air Development Center (which became Rome Laboratory (RL), which became Air Force Research Laboratory (AFRL)) |
| RAM | Random Access Memory |
| RAM | Random Access Memory |
| RAM | Reliability, Availability, Maintainability |
| RAM | Random Access Memory |
| RAM-C | Reliability, Availability, Maintainability and Cost |
| RAMS | Reliability and Maintainability Symposium |
| RAMS | Reliability and Maintainability Symposium |
| RAMS | Reliability and Maintainability Symposium |
| RCA | Root Cause Analysis |
| RCM | Reliability Centered Maintenance |
| RCM | Reliability-Centered Maintenance |
| RD | Random Defect |
| RD | Random Defect |
| RDGD | Reliability Development Growth Test |
| RDGD | Reliability Development Growth Test |
| RDSON | On-Drain Source Resistance |
| RDT | Reliability Demonstration Test |
| RDT | Reliability Demonstration Test |
| RDT | Reliability Development Test |
| RDT&E | Research, Development, Test and Evaluation |
| REG | Register |
| REG | Register |
| REMIS | Reliability and Maintainability Information System |
| RF | Radio Frequency |
| RF | Radio Frequency |
| RFP | Request for Proposal |
| RFP | Request for Proposal |
| RFP | Request For Proposal |
| RGC | Reliability Growth Curve |
| RGT | Reliability Growth Test |
| RGT | Reliability Growth Test |
| RGTMC | Reliability Growth Tracking Model - Continuous |
| RGTMD | Reliability Growth Tracking Model - Discrete |
| RH | Relative Humidity |
| RH | Relative Humidity |
| RIAC | Reliability Information Analysis Center |
| RISA | Reduced Instruction Set Architecture |
| RISA | Reduced Instruction Set Architecture |
| RISC | Reduced Instruction Set Computer |
| RISC | Reduced Instruction Set Computer |
| RIW | Reliability Improvement Warranty |
| RIW | Reliability Improvement Warranty |
| RL | Rome Laboratory |
| RL | Rome Laboratory |
| RL | Rome Laboratory |
| RMS | Reliability, Maintainability and Supportability |
| RMS | Root Mean Square |
| RMS | Root Mean Square |
| RMS | Reliability, Maintainability and Safety |
| ROC | Required Operational Capability |
| ROC | Required Operational Capability |
| ROM | Read Only Memory |
| ROM | Rough Order of Magnitude |
| ROM | Rough Order of Magnitude |
| ROM | Read Only Memory |
| RPM | Reliability Planning Management |
| RPN | Risk Priority Number |
| RPP | Reliability Program Plan |
| RQT | Reliability Qualification Test |
| RQT | Reliability Qualification Test |
| RQT | Reliability Qualification Test |
| RR | Requirements Review |
| RSA | Rapid Simulation Aids |
| RSA | Rapid Simulation Aids |
| RSR | Runtime Status Register |
| RSR | Runtime Status Register |
| RSS | Root-Sum-Squared |
| RTL | Register Transfer Language |
| RTL | Register Transfer Language |
| RTOK | Retest OK |
| RTOK | Retest Okay |
| RTQC | Real Time Quality Control |
| RTQC | Real Time Quality Control |
| RV | Random Vibration |
| RWG | Reliability Working Group |
| S | Second |
| S/N | Signal to Noise Ratio |
| S/N | Serial Number |
| S/N | Signal to Noise Ratio |
| S/W | Software |
| S/W | Software |
| SA | Sneak Analysis |
| SAE | Society of Automotive Engineers |
| SAF | Secretary of the Air Force |
| SAF | Secretary of the Air Force |
| SAI | Statistical Applications Institute |
| SAR | Synthetic Aperture Radar |
| SAR | Synthetic Aperture Radar |
| SAW | Surface Acoustic Wave |
| SAW | Surface Acoustic Wave |
| SBIR | Small Business Innovative Research |
| SBIR | Small Business Innovative Research |
| SC | Space Center |
| SC | Space Center |
| SCA | Sneak Circuit Analysis |
| SCA | Sneak Circuit Analysis |
| SCA | Sneak Circuit Analysis |
| SCARLET | Sneak Circuit Analysis Rome Laboratory Engineering Tool |
| SCARLET | Sneak Circuit Analysis Rome Laboratory Engineering Tool |
| SCAT | Sneak Circuit Analysis Tool |
| SCD | Specification Control Drawing |
| SCD | Specification Control Drawing |
| SCD | Source Control Drawing |
| SCR | Silicon Control Rectifier |
| SCR | Silicon Controlled Rectifier |
| SDI | Strategic Defense Initiative |
| SDL | System Description Language |
| SDL | System Descriptive Language |
| SDR | System Design Review |
| SDR | System Design Review |
| SDS | Structured Design System |
| SDS | Structured Design System |
| SE | Systems Engineering |
| SE | Simultaneous Engineering |
| SE | Support Equipment |
| SE | Support Equipment |
| SECDED | Single Error Correction, Double Error Detection |
| SECDED | Single Error Correction, Double Error Detection |
| SECDEF | Secretary of Defense |
| SECDEF | Secretary of Defense |
| SED | Single Error Detection |
| SED | Single Error Detection |
| SEDS | System Engineering Detailed Schedule |
| SEDS | System Engineering Detailed Schedule |
| SEM | Scanning Electron Microscope |
| SEM | Standard Electronic Module |
| SEM | Standard Electronic Module |
| SEMI | Special Electromagnetic Interference |
| SEMP | Systems Engineering Management Plan |
| SEMP | Systems Engineering Management Plan |
| SEMP | Systems Engineering Master Plan |
| SEP | Systems Engineering Plan |
| SER | Soft Error Rate |
| SER | Soft Error Rate |
| SERD | Support Equipment Recommended Data |
| SERD | Support Equipment Recommended Data |
| SEU | Single Event Upset |
| SEU | Single Event Upset |
| SF | Space Flight |
| SHARP | Standard Hardware Acquisition and Reliability Program |
| SIP | Single In-Line Package |
| SIP | Single In-Line Package |
| SMD | Standard Military Drawing |
| SMD | Standard Military Drawing |
| SMD | Surface Mounted Device |
| SMD | Surface Mounted Device |
| SMT | Surface Mounted Technology |
| SMT | Surface Mount Technology |
| SOA | Safe Operating Area |
| SOA | State-Of-The-Art |
| SOAR | State-of-the-Art Report |
| SOI | Silicon On Insulator |
| SOI | Silicon On Insulator |
| SOIC | Small Outline Integrated Circuit |
| SOIC | Small Outline Integrated Circuit |
| SOLE | Society of Logistics Engineers |
| SON | Statement of Need |
| SON | Statement of Need |
| SORD | Systems Operational Requirements Document |
| SORD | Systems Operational Requirements Document |
| SOS | Silicon On Sapphire |
| SOS | Silicon On Sapphire |
| SOW | Statement of Work |
| SOW | Statement of Work |
| SPAD | Scratch Pad Memory |
| SPAD | Scratch Pad Memory |
| SPC | Statistical Process Control |
| SPC | Statistical Process Control |
| SPC | Statistical Process Control |
| SPEC | Specification |
| SPLAN | AMSAA System Level Planning Model |
| SPO | System Program Office |
| SPO | System Program Office |
| SQC | Statistical Quality Control |
| SQC | Statistical Quality Control |
| SR | Slew Rate |
| SR | Slew Rate |
| SRA | Shop Replaceable Assembly |
| SRA | Shop Replaceable Assembly |
| SRAM | Static Random Access Memory |
| SRAM | Static Random Access Memory |
| SRAP | Semiconductor Reliability Assessment Program |
| SRD | Standard Reference Designator |
| SRD | System Requirement Document |
| SRD | System Requirement Document |
| SRL | Shift Register Latch |
| SRL | Shift Register Latch |
| SRR | Systems Requirement Review |
| SRR | Systems Requirement Review |
| SRU | Shop Replaceable Unit |
| SRU | Shop Replaceable Unit |
| SSA | Source Selection Authority |
| SSA | Software Sneak Analysis |
| SSA | Source Selection Authority |
| SSAC | Source Selection Advisory Council |
| SSAC | Source Selection Advisory Council |
| SSEB | Source Selections Evaluation Board |
| SSEB | Source Selections Evaluation Board |
| SSI | Small Scale Integration |
| SSI | Small Scale Integration |
| SSP | Source Selection Plan |
| SSP | Source Selection Plan |
| SSPA | Submicron Signal Processor Architecture |
| SSPA | Submicron Signal Processor Architecture |
| SSPLAN | AMSAA Subsystem Planning Model |
| SSR | Software Specification Review |
| SSR | Software Specification Review |
| SSTRACK | AMSAA Subsystem Tracking Model |
| ST | Self Test |
| ST | Self Test |
| STD | Standard |
| STD | Standard |
| STE | Special Test Equipment |
| STE | Special Test Equipment |
| STINFO | Scientific and Technical Information |
| STINFO | Scientific and Technical Information |
| STV | Steerable Television Set |
| STV | Steerable Television Set |
| SW | Software |
| SWFMEA | Software Failure Modes and Effects Analysis |
| t | Time |
| T | Temperature |
| t | Time |
| T | Temperature |
| T&E | Test and Evaluation |
| T&E | Test and Evaluation |
| T&E | Test & Evaluation |
| T&M | Time and Materials |
| Ta | Ambient Temperature |
| Tc | Case Temperature |
| Tj | Junction Temperature |
| Tstg | Storage Temperature |
| Ta | Ambient Temperature |
| TAAF | Test, Analyze and Fix |
| TAAF | Test-Analyze-and-Fix |
| TAB | Tape Automated Bonding |
| TAC | Tactical Air Command |
| TAFT | Test-Analyze-Fix-test |
| TBD | To Be Determined |
| TBD | To Be Determined |
| TBF | Time Between Failure |
| TBF | Time Between (Successive) Failures |
| TC | Temperature Cycle |
| TC | Temperature Coefficient |
| Tc | Case Temperature |
| TC | Temperature Coefficient |
| TCE | Thermal Coefficient of Expansion |
| TCE | Thermal Coefficient of Expansion |
| TCR | Temperature Coefficient of Resistance |
| TCR | Temperature Coefficient of Resistance |
| TDDB | Time Dependent Dielectric Breakdown |
| TDDB | Time Dependent Dielectric Breakdown |
| TDM | Time Division Multiplexing |
| TDM | Time Division Multiplexing |
| TDS | Technology Development Strategy |
| TEMP | Test and Evaluation Master Plan |
| TEMP | Test & Evaluation Master Plan |
| TEMP | Test & Evaluation Master Plan |
| TES | Test and Evaluation Strategy |
| TET | Technical Evaluation Team |
| TET | Technical Evaluation Team |
| TFOM | Testability Figure of Merit |
| Tj | Junction Temperature |
| TLCC | Total Life Cycle Cost |
| TLCC | Total Life Cycle Cost |
| TM | Technical Manuals |
| TM | Technical Manuals |
| TM | Test Modules |
| TM | Test Modules |
| TMDE | Test Measurement and Diagnostic Equipment |
| TMDE | Test Measurement and Diagnostic Equipment |
| TMP | Test and Maintenance Processor |
| TMP | Test and Maintenance Processor |
| TO | Technical Orders |
| TO | Technical Orders |
| TP | AMSAA Threshold Program |
| TPM | Technical Performance Measure |
| TPS | Test Program Set |
| TPS | Test Program Set |
| TPWG | Test Plan Working Group |
| TPWG | Test Plan Working Group |
| TQM | Total Quality Management |
| TQM | Total Quality Management |
| TR | Technical Requirement |
| TR | Technical Report |
| TRD | Test Requirements Document |
| TRD | Test Requirements Document |
| TRR | Test Readiness Review |
| TRR | Test Readiness Review |
| TS | Storage Time |
| TS | Test Statistic |
| TSMD | Time Stress Measurement Device |
| TSMD | Time Stress Measurement Device |
| TSMD | Time Stress Measurement Device |
| Tstg | Storage Temperature |
| TTL | Transistor-Transistor Logic |
| TTL | Transistor-Transistor Logic |
| TTSF | Time-to-System-Failure (Failure Arrival Time) |
| TTSF | Time to System Failure |
| TWT | Traveling Wave Tube |
| UCB | Upper Confidence Bound |
| UCL | Upper Confidence Limit |
| UCL | Upper Confidence Limit |
| UHF | Ultra High Frequency |
| UHF | Ultra High Frequency |
| ULSI | Ultra Large Scale Integration |
| ULSI | Ultra Large Scale Integration |
| UMF | Universal Matched Filter |
| UMF | Universal Matched Filter |
| URL | Uniform Resource Locator |
| USAF | United States Air Force |
| USAFE | United States Air Forces in Europe |
| USD(AT&L) | Under Secretary of Defense for Acquisition, Technology & Logistics |
| USL | Upper Specification Limit |
| USL | Upper Specification Limit |
| USN | United States Navy |
| UTS | Ultimate Tensile Strength |
| UUT | Unit Under Test |
| UUT | Unit Under Test |
| UV | Ultraviolet |
| UVPROM | Ultra-Violet Programmable Read Only Memory |
| UVPROM | Ultra-Violet Programmable Read Only Memory |
| V | Volt |
| V | Volt |
| VCE | Collector-Emitter Voltage |
| VCP | Very High Speed Integrated Circuit Communications Processor |
| VF | Forward Voltage |
| VTH | Threshold Voltage |
| VZ | Zener Voltage |
| VCP | Very High Speed Integrated Circuit Communications Processor |
| VGS | Visual Growth Suite |
| VHDL | Very High Speed Integrated Circuit Hardware Description Language |
| VHDL | Very High Speed Integrated Circuit Hardware Description Language |
| VHSIC | Very High Speed Integrated Circuit |
| VHSIC | Very High Speed Integrated Circuit |
| VIM | Very High Speed Integrated Circuit Insertion Module |
| VIM | Very High Speed Integrated Circuit Insertion Module |
| VLSI | Very Large Scale Integration |
| VLSI | Very Large Scale Integration |
| VSM | Very High Speed Integrated Circuit Submicron |
| VSM | Very High Speed Integrated Circuit Submicron |
| VSP | Variable Site Parameters |
| VSP | Variable Site Parameters |
| VSWR | Voltage Standing Wave Ratio |
| VTB | Very High Speed Integrated Circuit Technology Brassboard |
| VTB | Very High Speed Integrated Circuit Technology Brassboard |
| W | Watt |
| WAM | Window Addressable Memory |
| WAM | Window Addressable Memory |
| WBS | Work Breakdown Structure |
| WBS | Work Breakdown Structure |
| WCA | Worst-Case Analysis |
| WCCA | Worst Case Circuit Analysis |
| WOLF | Work Order Logistics File |
| WRA | Weapons Replaceable Assembly |
| WRSK | War Readiness Spares Kit |
| WRSK | War Readiness Spares Kit |
| WSARA | Weapons System Acquisition Reform Act |
| WSI | Wafer-Scale Integration |
| WSI | Wafer-Scale Integration |
| WSIC | Wafer-Scale Integrated Circuit |
| WSIC | Wafer-Scale Integrated Circuit |
| WUC | Work Unit Code |
| WUC | Work Unit Code |
| WWW | World Wide Web |
| X | Reactance |
| X | Reactance |
| XCVR | Transceiver |
| XCVR | Transceiver |
| Y | Admittance |
| Y | Admittance |
| Z | Impedance |
| Z | Impedance |
| ZZ | Zener Impedance |
| ZIF | Zero Insertion Force |
| ZIF | Zero Insertion Force |