3M | Maintenance, Material, Management System |
α | Producers Risk |
β | Consumers Risk |
λ | Failure Rate (1/Mean Time Between Failure) |
λA | Part (Active) Failure Rate |
λP | Part (Passive or Dormant) Failure Rate |
λT | Total Part (Active) Failure Rate |
μ | Arithmetic Mean |
μ | Repair Rate (1/Mean Corrective Maintenance Time) |
σ | Standard Deviation |
θ0 | Upper Test (Design Goal) Mean Time Between Failure |
θ1 | Lower Test (Unacceptable) Mean Time Between Failure |
θc-a | Case-to-Ambient Thermal Resistance |
θD | Demonstrated MTBF (Controlled Testing) |
θj-a | Junction-to-Ambient Thermal Resistance |
θj-c | Junction-to-Case Thermal Resistance |
θP | Predicted Mean Time Between Failure |
θ^ | Observed Point Estimate Mean Time Between Failure |
A | Ampere |
A/D | Analog-to-Digital |
Aa | Achieved Availability |
Ai | Inherent Availability |
AIC | Airborne Inhabited Cargo |
AIF | Airborne Inhabited Fighter |
Ao | Operational Availability |
AOL | Open Loop Gain |
AUC | Airborne Uninhabited Cargo |
AUF | Airborne Uninhabited Fighter |
AAA | Allocations Assessment and Analysis |
ABC | Activity-Based Costing |
ACC | Air Combat Command |
ACO | Administrative Contracting Officer |
ACO | Administrative Contracting Officer |
ACPM | AMSAA/Crow Projection Model |
ACQ | Acquisition |
ACQ | Acquisition |
ADAS | Architecture Design and Assessment Systems |
ADAS | Architecture Design and Assessment System |
ADM | Advanced Development Model |
ADM | Advanced Development Model |
ADP | Automatic Data Processing |
ADP | Automatic Data Processing |
ADPE | Automatic Data Processing Equipment |
ADPE | Automatic Data Processing Equipment |
AEC | Army Evaluation Center |
AES | Auger Electronic Spectroscopy |
AETC | Air Education and Training Command |
AFAE | Air Force Acquisition Executive |
AFAE | Air Force Acquisition Executive |
AFCC | Air Force Communication Command |
AFFSA | Air Force Flight Standards Agency |
AFFTC | Air Force Flight Test Center |
AFIT | Air Force Institute of Technology |
AFLMA | Air Force Logistics Management Agency |
AFMC | Air Force Materiel Command |
AFMC | Air Force Materiel Command |
AFOTEC | Air Force Operational Test and Evaluation Center |
AFOTEC | Air Force Operational Test and Evaluation Center |
AFPRO | Air Force Plant Representative Office |
AFR | Air Force Regulation |
AFR | Air Force Regulation |
AFRL | Air Force Research Laboratory |
AFSOC | Air Force Special Operations Command |
AFSPC | Air Force Space Command |
AFTO | Air Force Technical Order |
AFTO | Air Force Technical Order |
AGS | Ambiguity Group Size |
AGS | Ambiguity Group Size |
AI | Artificial Intelligence |
Ai | Inherent Availability |
AI | Artificial Intelligence |
AJ | Antijam |
AJ | Antijam |
ALC | Air Logistics Center |
ALC | Air Logistics Center |
ALT | Accelerated Life Testing |
ALU | Arithmetic Logic Unit |
ALU | Arithmetic Logic Unit |
AMC | Air Mobility Command |
AMEC | Army Management Engineering College |
AMGS | Automatic Microcode Generation System |
AMGS | Automatic Microcode Generation System |
AMPM | AMSAA Maturity Projection Model |
AMSAA | U.S. Army Materiel System Analysis Activity |
AMSDL | Acquisition Management Systems and Data Control List |
AMSDL | Acquisition Management Systems and Data Control List |
ANOVA | Analysis of Variance |
ANSI | American National Standards Institute |
ANSI | American National Standards Institute |
Ao | Operational Availability |
AOA | Analysis of Alternatives |
AP | Array Processor |
AP | Array Processor |
APD | Avalanche Photo Diode |
APD | Avalanche Photo Diode |
APTE | Automatic Programmed Test Equipment |
APTE | Automatic Programmed Test Equipment |
APU | Auxiliary Power Unit |
APU | Auxiliary Power Unit |
ARM | Antiradiation Missile |
ARM | Antiradiation Missile |
ARP | Armament Recording Program |
ARW | Airborne Rotary Wing |
ASA | Advanced Systems Architecture |
ASA | Advanced Systems Architecture |
ASA(ALT) | Assistant Secretary of the Army (Acquisition, Technology and Logistics) |
ASC | Aeronautical Systems Center |
ASC | Aeronautical Systems Center |
ASIC | Application Specific Integrated Circuit |
ASIC | Application Specific Integrated Circuit |
ASME | American Society of Mechanical Engineers |
ASQC | American Society of Quality Control |
AST | Accelerated Stress Testing |
ASTM | American Society for Testing and Materials |
ASTM | American Society for Testing and Materials |
ATC | Air Training Command |
ATC | Air Training Command |
ATE | Automatic/Automated Test Equipment |
ATE | Automatic/Automated Test Equipment |
ATEC | Army Test and Evaluation Command |
ATF | Advanced Tactical Fighter |
ATF | Advanced Tactical Fighter |
ATG | Automatic Test Generation |
ATG | Automatic Test Generation |
ATP | Acceptance Test Procedure |
ATP | Acceptance Test Procedure |
ATPG | Automatic Test Pattern Generator |
ATTD | Advanced Technology Transition Demonstration |
ATTD | Advanced Technology Transition Demonstration |
AV SOA | Acquisition Visibility Service Oriented Architecture |
AVIP | Avionics Integrity Program |
AVIP | Avionics Integrity Program |
b | billion |
b | BIT |
b | BIT |
B/S or bps Bits Per Second | |
BAFO | Best and Final Offer |
BAFO | Best and Final Offer |
BB, B/B | Brass Board |
BB, B/B | Brass Board |
BCC | Block Check-Sum Character |
BCC | Block Check-Sum Character |
BCS | Bench Check Serviceable |
BCS | Bench Check Serviceable |
BCWP | Budget Cost of Work Performed |
BCWP | Budget Cost of Work Performed |
BCWS | Budget Cost of Work Scheduled |
BCWS | Budget Cost of Work Scheduled |
BEA | Budget Estimate Agreement |
BEA | Budget Estimate Agreement |
BELL | Bell Labs |
BES | Budget Estimate Submission |
BES | Budget Estimate Submission |
BGA | Ball-Grid Array |
BIMOS | Bipolar/Metal Oxide Semiconductor |
BIMOS | Bipolar/Metal Oxide Semiconductor |
BIST | Built-in Self Test |
BIST | Built-in Self Test |
BIT | Built-In Test |
BIT | Built-In-Test |
BIT | Built-In-Test |
BITE | Built-In-Test Equipment |
BITE | Built-In-Test Equipment |
BIU | Bus Interface Unit |
BIU | Bus Interface Unit |
BJT | Bipolar Junction Transistor |
BJT | Bipolar Junction Transistor |
BLER | Block Error Rate |
BLER | Block Error Rate |
BMD | Ballistic Missile Defense |
BPPBS | Biennial Planning, Programming, and Budgeting System |
BPPBS | Biennial Planning, Programming, and Budgeting System |
bps, B/S | Bits Per Second |
C | Centigrade |
C | Centigrade |
C3 | Command, Control and Communications |
C3CM | Command, Control, Communications and Countermeasures |
C3I | Command, Control, Communications Intelligence |
C&E | Cause and Effect |
C-ROM | Control Read Only Memory |
C-ROM | Control Read Only Memory |
Cp | Process Capability Index |
Cpk | Process Performance Index |
C3 | Command, Control and Communications |
C3CM | Command, Control, Communications and Countermeasures |
C3I | Command, Control, Communications Intelligence |
CA | Corrective Action |
CA | Contracting Activity |
CA | Contracting Activity |
CAD | Computer-Aided Design |
CAD | Computer Aided Design |
CAD | Computer Aided Design |
CADBIT | Computer Aided Design for Built-In Test |
CADBIT | Computer Aided Design for Built-In Test |
CAE | Continuous Analog Estimators |
CAE | Computer Aided Engineering |
CAE | Computer-Aided Engineering |
CAE | Computer Aided Engineering |
CALS | Computer Aided Acquisition Logistics & Support |
CALS | Continuous Acquisition and Life-Cycle Support |
CAM | Computer-Aided Manufacturing |
CAM | Content Addressable Memory |
CAM | Content Addressable Memory |
CAP | Corrective Action Period |
CAS | Column Address Strobe |
CAS | Column Address Strobe |
CASE | Computer-Aided Software Engineering |
CASS | Computer Aided Schematic System |
CASS | Computer Aided Schematic System |
CAT | Computer Aided Test |
CAT | Computer Aided Test |
CB | Chip Boundary |
CB | Chip Boundary |
CBS | Cost Breakdown Structure |
CCA | Circuit Card Assembly |
CCB | Configuration Control Board |
CCB | Capacitive Coupled BIT |
CCB | Capacitive Coupled Bit |
CCB | Configuration Control Board |
CCC | Ceramic Chip Carrier |
CCC | Ceramic Chip Carrier |
CCD | Charge Coupled Device |
CCD | Charged Coupled Device |
CD | Compact Disc |
CD-ROM | Compact Disc-Read Only Memory |
CDD | Capability Development Document |
CDF | Cumulative Density Function |
CDF | Cumulative Distribution Function |
CDF | Cumulative Density Function |
CDIP | Ceramic Dual In-Line Package |
CDIP | Ceramic Dual-In-Line Package |
CDR | Critical Design Review |
CDR | Critical Design Review |
CDR | Critical Design Review |
CDRL | Contract Data Requirements List |
CDRL | Contract Data Requirements List |
CE | Concurrent Engineering |
CEO | Chief Executive Officer |
CER | Cost Estimating Relationship |
CFAR | Constant False Alarm Rate |
CFAR | Constant False Alarm Rate |
CFE | Contractor Furnished Equipment |
CFE | Contractor Furnished Equipment |
CFI | Contractor-Furnished Items |
CFSR | Contract Fund Status Report |
CFSR | Contract Fund Status Report |
CGA | Configurable Gate Array |
CGA | Configurable Gate Array |
CI | Configuration Item |
CI | Configuration Item |
CI | Confidence Interval |
CIM | Computer Integrated Manufacturing |
CIM | Computer Integrated Manufacturing |
CINC | Commander-In-Chief |
CINC | Commander-in-Chief |
CISC | Complex Instruction Set Computer |
CISC | Complex Instruction Set Computer |
CIU | Control Interface Unit |
CIU | Control Interface Unit |
CLCC | Ceramic Leaded Chip Carrier |
CLCC | Ceramic Leaded Chip Carrier |
CLIN | Contract Line Item Number |
CLIN | Contract Line Item Number |
CM | Corrective Maintenance |
CM | Centimeter |
cm | Centimeter |
CM | Configuration Manager or Management |
CM | Corrective Maintenance |
CM | Configuration Manager or Management |
CML | Current Mode Logic |
CML | Current Mode Logic |
CMM | Capability Maturity Model |
CMOS | Complementary Metal Oxide Semiconductor |
CMOS | Complementary Metal Oxide Semiconductor |
CND | Can Not Duplicate |
CND | Can Not Duplicate |
CNI | Communications, Navigation, and Identification |
CNI | Communications, Navigation and Identification |
CO | Contracting Officer |
CO | Contracting Officer |
CODEC | Coder Decoder |
CODEC | Coder Decoder |
COMM | Communications |
COMM | Communications |
COMSEC | Communications Security |
COMSEC | Communications Security |
COPS | Complex Operations Per Second |
COPS | Complex Operations Per Second |
COTS | Commercial Off-The-Shelf |
COTS | Commercial Off-the-Shelf |
CPCI | Computer Program Configuration Item |
CPCI | Computer Program Configuration Item |
CPFF | Cost-Plus-Fixed-Fee |
CPFF | Cost-Plus-Fixed-Fee |
CPIF | Cost-Plus-Incentive-Fee |
CPIF | Cost-Plus-Incentive-Fee |
CPM | Control Processor Module |
CPM | Control Processor Module |
CPSC | Consumer Product Safety Commission |
CPU | Central Processing Unit |
CPU | Central Processing Unit |
CPU | Central Processing Unit |
CRC | Cyclic Redundance Check |
CRC | Cyclic Redundance Check |
CRTA | Critical Reliability Technology Assessment |
CS | Chip Select |
CS | Chip Select |
CSC | Computer Software Component |
CSC | Computer Software Component |
CSC | Computer Software Component |
CSCI | Computer Software Configuration Item |
CSCI | Computer Software Configuration Item |
CSCI | Computer Software Configuration Item |
CSDR | Cost and Software Data Reporting |
CSP | Common Signal Processor |
CSP | Common Signal Processor |
CSR | Control Status Register |
CSR | Control Status Register |
CSU | Computer Software Unit |
CTE | Coefficient of Thermal Expansion |
CTE | Coefficient of Thermal Expansion |
CTE | Coefficient of Thermal Expansion |
CTR | Current Transfer Ratio |
CTR | Current Transfer Ratio |
CUSUM | Cumulative Sum |
CV | Capacitance-Voltage |
CV | Capacitance-Voltage |
D Level | Depot Level |
D-Level | Depot Level |
D/A | Digital-to-Analog |
D/A | Digital-to-Analog |
DAB | Defense Acquisition Board |
DAB | Defense Acquisition Board |
DAG | Defense Acquisition Guidebook |
DAMIR | Defense Acquisition Management Information Retrieval |
dB | Decibel |
dB | Decibel |
DC | Duty Cycle |
dc | Direct Current |
dc | Direct Current |
DC | Duty Cycle |
DECTED | Double Error Correcting, Triple Error Detecting |
DECTED | Double Error Correcting, Triple Error Detecting |
DED | Double Error Detection |
DED | Double Error Detection |
DEM/VAL | Demonstration and Validation |
DEM/VAL | Demonstration and Validation |
DESC | Defense Electronics Supply Center |
DESC | Defense Electronics Supply Center |
df | Degrees of Freedom |
DF | Dissipation Factor |
DFARS | Defense Federal Acquisition Regulations |
dferr | Degrees of Freedom for the Error |
dfF | Degrees of Freedom for a Factor |
DFM | Design for Manufacturing |
DFMEA | Design Failure Modes and Effects Analysis |
DFR | Design for Reliability |
DID | Data Item Description |
DID | Data Item Description |
DID | Data Item Description |
DIP | Dual In-line Package |
DIP | Dual In-Line Package |
DIP | Dual In-Line Package |
DISC | Defense Industrial Supply Center |
DISC | Defense Industrial Supply Center |
DLA | Defense Logistics Agency |
DLA | Defense Logistics Agency |
DMR | Defense Management Review |
DMR | Defense Management Review |
DoD | Department of Defense |
DoD | U.S. Department of Defense |
DOD | Department of Defense |
DoD | Department of Defense |
DoD-ADL | Department of Defense Authorized Data List |
DoD-ADL | Department of Defense Authorized Data List |
DODI | Department of Defense Instruction |
DOE | Design of Experiments |
DOE | Design of Experiments |
DOE | Design of Experiments |
DOS | Disk Operating System |
DOS | Disk Operating System |
DP | Data Processor |
DP | Data Processor |
DPA | Destructive Physical Analysis |
DPA | Destructive Physical Analysis |
DPM | AMSAA Discrete Projection Model |
DR | Damage Ratio |
DR | Design Review |
DR | Discrimination Ratio |
DRAM | Dynamic Random Access Memory |
DRAM | Dynamic Random Access Memory |
DRS | Deficiency Reporting System |
DRS | Deficiency Reporting System |
DSP | Digital Signal Processing |
DSP | Digital Signal Processing |
DT&E | Development Test & Evaluation |
DT&E | Developmental Test and Evaluation |
DT&E | Development Test and Evaluation |
DTIC | Defense Technical Information Center |
DTIC | Defense Technical Information Center |
DTM | Defense Technical Memorandum |
DUT | Device Under Test |
DUT | Device Under Test |
Ea | Activation Energy in Electron Volts |
Ea | Activation Energy in Electron Volts |
EAROM | Electrically Alterable Read Only Memory |
EAROM | Electrically Alterable Read Only Memory |
ECC | Error Checking and Correction |
ECC | Error Checking and Correction |
ECCM | Electronic Counter Countermeasures |
ECCM | Electronic Counter Countermeasures |
ECF | Effective Cumulative Failures |
ECL | Emitter Coupled Logic |
ECL | Emitter Coupled Logic |
ECM | Electronic Countermeasures |
ECM | Electronic Countermeasures |
ECP | Engineering Change Proposal |
ECP | Engineering Change Proposal |
ECP | Engineering Change Proposal |
ECS | Environmental Control System |
ECU | Environmental Control Unit |
ECU | Environmental Control Unit |
EDA | Electronic Design Automation |
EDA | Electronic Design Automation |
EDAC | Error Detection and Correction |
EDAC | Error Detection and Correction |
EDAX | Energy Dispersive Analysis by X-Ray |
EDM | Engineering Development Model |
EDM | Engineering Development Model |
EEC | European Economic Community |
EEPROM | Electrically Erasable Programmable Read Only Memory |
EEPROM | Electrically Erasable Programmable Read Only Memory |
EGC | Electronic Gate Count |
EGC | Electronic Gate Count |
EGS | Electronic Ground System |
EGS | Electronic Ground System |
EGSE | Electronic Ground Support Equipment |
EGSE | Electronic Ground Support Equipment |
EIA | Electronics Industries Association |
EM | Electromagnetic |
EM | Electromigration |
EM | Electromigration |
EMC | Electromagnetic Compatibility |
EMC | Electromagnetic Compatibility |
EMD | Engineering and Manufacturing Development |
EMD | Engineering and Manufacturing Development |
EMD | Engineering and Management Development |
EMI | Electromagnetic Interface |
EMI | Electromagnetic Interference |
EMI | Electromagnetic Interference |
EMP | Electromagnetic Pulse |
EMP | Electronic Magnetic Pulse |
EO | Electro-optical |
EO | Electro-Optical |
EOS | Electrical Overstress |
EOS | Electrical Overstress |
Eox | Electronic Field Strength in Oxide |
Eox | Electronic Field Strength in Oxide |
EP | Electrical Parameter |
EP | Electrical Parameter |
EPA | Environmental Protection Agency |
EPC | Engineering Process Control |
EPRD | Electronic Parts Reliability Databook |
EPRI | Electronic Power Research Institute |
EPROM | Erasable Programmable Read Only Memory |
EPROM | Erasable Programmable Read Only Memory |
ER | Established Reliability |
ER Part | Established Reliability Part |
ERC | Electrical Rule Check |
ERC | Electrical Rule Check |
ESC | Electronic System Center |
ESC | Electronic System Center |
ESD | Electrostatic Discharge |
ESD | Electrostatic Discharge |
ESM | Electronics Support Measure |
ESM | Electronics Support Measure |
ESR | Equivalent Series Resistance |
ESS | Environmental Stress Screening |
ESS | Environmental Stress Screening |
ESS | Environmental Stress Screening |
ETE | Electronic or External Test Equipment |
ETE | Electronic or External Test Equipment |
eV | Electron Volt |
eV | Electron Volt |
EVA | Extreme Value Analysis |
EW | Electronic Warfare |
EW | Electronic Warfare |
EWMA | Exponentially-Weighted Moving Average |
EXP | Exponent |
EXP | Exponent |
F | F-Ratio Statistic |
F/W | Firmware |
F/W | Firmware |
FA | False Alarm |
FA | False Alarm |
FAA | Federal Aviation Administration |
FAB | Fabrication |
FAB | Fabrication |
FAR | Federal Acquisition Regulation |
FAR | False Alarm Rate |
FAR | False Alarm Rate |
FAR | Federal Acquisition Regulation |
FARR | Forward Area Alerting Radar Receiver |
FARR | Forward Area Alerting Radar Receiver |
FAT | First Article Testing |
FAT | First Article Testing |
FBT | Functional Board Test |
FBT | Functional Board Test |
FCA | Functional Configuration Audit |
FCA | Functional Configuration Audit |
FD | Fault Detection |
FD | Fault Detection |
FD | Fault Detection |
FD/SC | Failure Definition/Scoring Criteria |
FDI | Fault Detection and Isolation |
FDI | Fault Detection and Isolation |
FEA | Finite Element Analysis |
FEA | Finite Element Analysis |
FEF | Fix Effectiveness Factor |
FEM | Finite Element Model |
FET | Field Effect Transistor |
FET | Field Effect Transistor |
FFD | Fraction of Faults Detected |
FFD | Fraction of Faults Detected |
FFI | Fraction of Faults Isolated |
FFI | Fraction of Faults Isolated |
FFP | Firm Fixed Price |
FFP | Firm Fixed Price |
FFRP | Field Failure Return Program |
FFT | Fast Fourier Transform |
FFT | Fast Fourier Transform |
FFTAU | Fast Fourier Transform Arithmetic Unit |
FFTAU | Fast Fourier Transform Arithmetic Unit |
FFTCU | Fast Fourier Transform Control Unit |
FFTCU | Fast Fourier Transform Control Unit |
FH | Flight Hours |
FHA | Fault Hazard Analysis |
FI | Fault Isolation |
FI | Fault Isolation |
FI | Fault Isolation |
FIFO | First In First Out |
FIFO | First In First Out |
FILO | First In Last Out |
FILO | First In Last Out |
FIR | Fault Isolation Resolution |
FIR | Fault Isolation Resolution |
FIT | Fault Isolation Test |
FIT | Fault Isolation Test |
FITS | Failures Per 109 hours |
FITS | Failure Per 109 Hours |
FLIR | Forward Looking Infrared |
FLIR | Forward Looking Infrared |
FLOPS | Floating Point Operations Per Second |
FLOTOX | Floating Gate Tunnel-Oxide |
FLOTOX | Floating Gate Tunnel - Oxide |
FM | Failure Mode |
FMC | Full Mission Capability |
FMC | Full Mission Capability |
FMEA | Failure Modes and Effects Analysis |
FMEA | Failure Modes and Effects Analysis |
FMEA | Failure Modes and Effects Analysis |
FMECA | Failure Modes, Effects and Criticality Analysis |
FMECA | Failure Modes, Effects and Criticality Analysis |
FMECA | Failure Modes, Effects and Criticality Analysis |
FOC | Full Operational Capability |
FOM | Figure of Merit |
FOM | Figure of Merit |
FOV | Field of View |
FOV | Field of View |
FP | Floating Point |
FP | Floating Point |
FPA | Focal Plane Array |
FPA | Focal Plane Array |
FPAP | Floating Point Array Processor |
FPAP | Floating Point Array Processor |
FPLA | Field Programmable Logic Array |
FPLA | Field Programmable Logic Array |
FPMFH | Failure Per Million Flight Hours |
FPMFH | Failures Per Million Flight Hours |
FPMH | Failures Per Million Hours |
FPMH | Failures Per Million Hours |
FPPE | Floating Point Processing Element |
FPPE | Floating Point Processing Element |
FPRB | Failure Prevention Review Board |
FQR | Formal Qualification Review |
FQR | Formal Qualification Review |
FQT | Final Qualification Test |
FQT | Final Qualification Test |
FR | Failure Rate |
FR | Failure Rate |
FRACAS | Failure Reporting and Corrective Action System |
FRACAS | Failure Reporting and Corrective Action System |
FRACAS | Failure Reporting, Analysis and Corrective Action System |
FRB | Failure Review Board |
FRB | Failure Review Board |
FRB | Failure Review Board |
FRP | Full Rate Production |
FS | Full Scale |
FS | Full Scale |
FSC | Federal Stock Class or Federal Supply Classification |
FSD | Full Scale Development |
FSD | Full Scale Development |
FSED | Full Scale Engineering Development |
FSED | Full Scale Engineering Development |
FT | Fourier Transform |
FT | Fourier Transform |
FTA | Fault Tree Analysis |
FTA | Fault Tree Analysis |
ftp | File Transfer Protocol |
FTTL | Fast Transistor-Transistor Logic |
FTTL | Fast Transistor - Transistor Logic |
FY | Fiscal Year |
FY | Fiscal Year |
GaAs | Gallium Arsenide |
GaAs | Gallium Arsenide |
GAO | General Accounting Office |
GAO | General Accounting Office |
GB | Gigabyte |
GB | Ground Benign |
GD | Global Defect |
GD | Global Defect |
GEIA | Government Electronics & Information Technology Association (now TechAmerica) |
GF | Ground Fixed |
GFE | Government Furnished Equipment |
GFE | Government Furnished Equipment |
GFP | Government Furnished Property |
GFP | Government Furnished Property |
GHz | Gigahertz |
GIDEP | Government Industry Data Exchange Program |
GIDEP | Government Industry Data Exchange Program |
GIMADS | Generic Integrated Maintenance Diagnostic |
GM | Ground Mobile |
GM | Global Memory |
GM | Global Memory |
GOCO | Government Owned Contractor Operated |
GOCO | Government Owned Contractor Operated |
GOF | Goodness-of-Fit |
GOMAC | Government Microcircuit Applications Conference |
GOMAC | Government Microcircuit Applications Conference |
GP | Growth Potential |
GSE | Ground Support Equipment |
GSE | Ground Support Equipment |
GSPA | Generic Signal Processor Architecture |
GSPA | Generic Signal Processor Architecture |
H/W | Hardware |
H/W | Hardware |
HALT | Highly Accelerated Life Test |
HALT | Highly Accelerated Life Testing |
HASS | Highly Accelerated Stress Screening |
HAST | Highly Accelerated Stress Testing |
HAST | Highly Accelerated Stress Test |
HDBK | Handbook |
HDL | Hardware Description Language |
HDL | Hardware Description Language |
HDS | Hierarchical Design System |
HDS | Hierarchical Design System |
HEMT | High Electron Mobility Transistor |
HEMT | High Electron Mobility Transistor |
HFE | Gain |
HFTA | Hardware Fault Tree Analysis |
HFTA | Hardware Fault Tree Analysis |
HHDL | Hierarchical Hardware Description Language |
HHDL | Hierarchical Hardware Description Language |
HMOS | High Performance Metal Oxide Semiconductor |
HMOS | High Performance Metal Oxide Semiconductor |
HOL | Higher Order Language |
HOL | Higher Order Language |
HPP | Homogeneous Poisson Process |
HPP | Homogeneous Poisson Process |
HSI | Human Systems Integration |
html | HyperText Markup Language |
http | HyperText Transmission Protocol |
HWCI | Hardware Configuration Item |
HWCI | Hardware Configuration Item |
Hz | Hertz |
Hz | Hertz |
I | Current |
I | Current |
I Level | Intermediate Level |
I-Level | Intermediate Level |
I/O | Input/Output |
I/O | Input/Output |
IAC | Information Analysis Center |
IAC | Information Analysis Center |
IAW | In Accordance With |
IAW | In Accordance With |
IC | Integrated Circuit |
IC | Integrated Circuit |
ICBO | Collector-Base Output Current |
ICD | Interface Control Document |
ICD | Interface Control Document |
ICNIA | Integrated Communications, Navigation and Identification Avionics |
ICT | In Circuit Testing |
ICT | In Circuit Testing |
ICWG | Interface Control Working Group |
ICWG | Interface Control Working Group |
Id | Drain Current |
ID | Integrated Diagnostics |
Id | Drain Current |
ID | Integrated Diagnostics |
IDAS | Integrated Design Automation System |
IDAS | Integrated Design Automation System |
IDHS | Intelligence Data Handling System |
IDHS | Intelligence Data Handling System |
IEC | International Electrotechnical Commission |
IEEE | Institute of Electrical and Electronic Engineers |
IEEE | Institute of Electrical and Electronics Engineers |
IEEE | Institute of Electrical and Electronic Engineers |
IEST | Institute of Environmental Sciencies and Technology |
IEST | Institute of Environmental Sciences and Technology |
IF | Interface |
IF | Interface |
IFB | Invitation for Bid |
IFB | Invitation for Bid |
IFF | Identification Friend or Foe |
IFF | Identification Friend or Foe |
IFFT | Inverse Fast Fourier Transform |
IFFT | Inverse Fast Fourier Transform |
IG | Inspector General |
IG | Inspector General |
IGC | Idealized Growth Curve |
ILD | Injection Laser Diode |
ILD | Injection Laser Diode |
ILS | Integrated Logistics Support |
ILS | Integrated Logistics Support |
ILSM | Integrated Logistics Support Manager |
ILSM | Integrated Logistics Support Manager |
IMPATT | Impact Avalanche and Transit Time |
IMPATT | Impact Avalanche and Transit Time |
INEWS | Integrated Electronic Warfare System |
INEWS | Integrated Electronic Warfare System |
IOC | Initial Operational Capability |
IOC | Initial Operational Capability |
IOC | Initial Operational Capability |
IOT | Initial Operational Test |
IOT&E | Initial Operational Test & Evaluation |
IOT&E | Initial Operational Test & Evaluation |
IOT&E | Initial Operational Test & Evaluation |
IPD | Integrated Product Development |
IPOUND | Intermittent; Partial; Over; Unintended; Negative; Degraded |
IPT | Integrated Product Team |
IR | Reverse Current |
IR&D | Independent Research & Development |
IR&D | Independent Research & Development |
IRPS | International Reliability Physics Symposium |
IRPS | International Reliability Physics Symposium |
IRPS | International Reliability Physics Symposium |
ISA | Instruction Set Architecture |
ISA | Instruction Set Architecture |
ISO | International Standards Organization |
ISPS | Instruction Set Processor Specification |
ISPS | Instruction Set Processor Specification |
Isub | Substrate Current |
Isub | Substrate Current |
ITAR | International Traffic in Arms Regulation |
ITAR | International Traffic In Arms Regulation |
ITM | Integrated Test and Maintenance |
ITM | Integrated Test and Maintenance |
IWSM | Integrated Weapons Systems Management |
IWSM | Integrated Weapons System Management |
J | Current Density |
J | Current Density |
JAN | Joint Army Navy |
JAN | Joint Army Navy |
JCIDS | Joint Capabilities Integration Development System |
JCS | Joint Chiefs of Staff |
JCS | Joint Chiefs of Staff |
JEDEC | Joint Electron Device Engineering Council |
JEDEC | Joint Electron Device Engineering Council |
JFET | Junction Field Effect Transistor |
JFET | Junction Field Effect Transistor |
JIPM | Japanese Institute of Plant Maintenance |
JSC | Johnson Space Center |
JTAG | Joint Test Action Group |
JTAG | Joint Test Action Group |
k | Boltzman''s Constant (8' + frmMain.DecimalSeparator + '65 x 10-5 electron volts/°Kelvin) |
K | Thousand |
K | Thousand |
k | Boltzmans Constant (8.65 x 10-5 electron volts/°Kelvin |
K | Kelvin |
KHB | Kennedy Handbook |
KOPS | Thousands of Operations per Second |
KOPS | Thousands of Operations Per Second |
KPIV | Key Process Input Variable |
KPOV | Key Process Output Variable |
LAN | Local Area Network |
LAN | Local Area Network |
LCB | Lower Confidence Bound |
LCC | Leadless Chip Carrier |
LCC | Life Cycle Cost |
LCC | Leadless Chip Carrier |
LCC | Life Cycle Cost |
LCC | Life Cycle Cost |
LCCA | Life Cycle Cost Analysis |
LCCC | Leadless Ceramic Chip Carrier |
LCCC | Leadless Ceramic Chip Carrier |
LCL | Lower Confidence Limit |
LCL | Lower Confidence Limit |
LCSP | Life-Cycle Sustainment Plan |
LED | Light Emitting Dioide |
LED | Light Emitting Diode |
LEX | Life Extension |
LFR | Launch and Flight Reliability |
LFR | Launch and Flight Reliability |
LHR | Low Hop Rate |
LHR | Low Hop Rate |
LIF | Low Insertion Force |
LIF | Low Insertion Force |
LIFO | Last In First Out |
LIFO | Last In First Out |
LISP | List Processing |
LISP | List Processing |
LOC | Lines of Code |
LRIP | Low Rate Initial Production |
LRM | Line Replaceable Module |
LRM | Line Replaceable Module |
LRU | Line Replaceable Unit |
LRU | Line Replaceable Unit |
LS | Least Squares |
LSA | Logistics Support Analysis |
LSA | Logistics Support Analysis |
LSAR | Logistics Support Analysis Record |
LSAR | Logistics Support Analysis Record |
LSB | Least Significant Bit |
LSB | Least Significant Bit |
LSE | Lead System Engineer |
LSE | Lead System Engineer |
LSI | Large Scale Integration |
LSI | Large Scale Integration |
LSL | Lower Specification Limit |
LSL | Lower Specification Limit |
LSSD | Level Sensitive Scan Design |
LSSD | Level Sensitive Scan Design |
LSTTL | Low Power Schottky Transistor-Transistor Logic |
LSTTL | Low Power Schottky Transistor Transistor Logic |
LUT | Look Up Table |
LUT | Look Up Table |
M | Maintainability |
m | Million |
m | million |
M | Maintainability |
M&S | Modeling & Simulation |
M-Demo | Maintainability Demonstration |
M-MM | Mean Maintenance Manhours |
M-MM | Mean Maintenance Manhours |
Mct | Mean Corrective Maintenance Time |
mA | Milliampere |
mA | Milliampere |
MAC | Multiplier Accumulator Chip |
MAC | Multiplier Accumulator Chip |
MAJCOM | Major Command |
MAJCOM | Major Command |
MAP | Modular Avionics Package |
MAP | Modular Avionics Package |
MB | Megabyte |
Mb | Megabit |
MBPS | Million Bits Per Second |
MBPS | Million Bits Per Second |
MCA | Monte Carlo Analysis |
MCCR | Mission Critical Computer Resources |
MCCR | Mission Critical Computer Resources |
MCFOS | Military Computer Family Operating System |
MCFOS | Military Computer Family Operating System |
MCM | Multichip Module |
MCOPS | Million Complex Operations Per Second |
MCOPS | Million Complex Operations Per Second |
Mct | Mean Corrective Maintenance Time |
MCTL | Military Critical Technology List |
MCTL | Military Critical Technology List |
MCU | Microcontrol Unit |
MCU | Microcontrol Unit |
MD | Maintainability Demonstration |
MDA | Milestone Decision Authority |
MDAP | Major Defense Acquisition Program |
MDCS | Maintenance Data Collection System |
MDCS | Maintenance Data Collection System |
MDM | Multiplexer/Demultiplexer |
MDM | Multiplexer/Demultiplexer |
MDR | Microcircuit Device Reliability |
MDR | Microcircuit Device Reliability |
MDS | Mission/Design/Series |
MDT | Mean Down Time |
MDT | Mean Downtime |
MDT | Mean Downtime |
MELF | Metal Electrode Face |
MELF | Metal Electrode Face |
MENS | Mission Equipment Needs Statement |
MENS | Mission Element Needs Statement |
MENS | Mission Element Needs Statement |
MENS | Mission Equipment Needs Statement |
MESL | Mission-Essential Systems (or Subsystems) List |
MFHBF | Mean Flying Hours Between Failure |
MFHBMCF | Mean Flying Hours Between Mission Critical Failures |
MFHBUMA | Mean Flying Hours Between Unscheduled Maintenance Actions |
MFLOPS | Million Floating Point Operations Per Second |
MFLOPS | Million Floating Point Operations Per Second |
MFPT | Machinery Failure Prevention Technology |
MHz | Megahertz |
Mhz | Megahertz |
MICAP | Mission Capability |
Mil | 1/1000th of an Inch |
Mil | 1000th of an Inch |
MIL | Military |
MIL-HDBK | U.S. DoD Military Handbook |
MIL-STD | U.S. DoD Military Standard |
MIL-STD | Military Standard |
MIL-STD | Military Standard |
MIMIC | Microwave Millimeter Wave Monolithic Integrated Circuit |
MIMIC | Microwave Millimeter Wave Monolithic Integrated Circuit |
MIN | Maintenance Interface Network |
MIN | Maintenance Interface Network |
MIPS | Million Instructions Per Second |
MIPS | Million Instructions Per Second |
MISD | Multiple Instructions Single Data |
MISD | Multiple Instructions Single Data |
ML | Maximum Likelihood |
MLB | Multilayer Board |
MLB | Multilayer Board |
MLE | Maximum Likelihood Estimate |
MLH/OH | Maintenance Labor Hour per Operating Hour |
MLIPS | Million Logic Inferences/Instructions Per Second |
MLIPS | Million Logic Inferences/Instructions Per Second |
mm | Millimeter |
mm | Millimeter |
MMBF | Mean Miles Between Failure |
MMBF | Mean Miles Between Failure |
MMBF | Mean Miles Between Failure |
MMD | Mean Mission Duration |
MMD | Mean Mission Duration |
MMH/FH | Maintenance Manhours Per Flight Hour |
MMH/FH | Maintenance Manhours Per Flight Hour |
MMH/PH | Maintenance Manhours Per Possessed Hour |
MMH/PH | Mean Manhours Per Possessed Hour |
MMIC | Monolithic Microwave Integrated Circuit |
MMIC | Monolithic Microwave Integrated Circuit |
MMM | Mass Memory Module |
MMM | Mass Memory Module |
MMPS | Million Multiples Per Second |
MMPS | Million Multiples Per Second |
MMR | Multimode Radar |
MMR | Multimode Radar |
MMS | Mass Memory Superchip |
MMS | Mass Memory Superchip |
MMW | Millimeter Wave |
MMW | Millimeter Wave |
MN | Maintenance Node |
MN | Maintenance Node |
MNN | Maintenance Network Node |
MNN | Maintenance Network Node |
MNS | Mission Need Statement |
MNS | Mission Need Statement |
MOA | Memorandum of Agreement |
MOA | Memorandum of Agreement |
MODEM | Modulator Demodulator |
MODEM | Modulator Demodulator |
MOPS | Million Operations Per Second |
MOPS | Million Operations Per Second |
MOS | Metal Oxide Semiconductor |
MOS | Metal Oxide Semiconductor |
MOSFET | Metal Oxide Semiconductor Field Effect Transistor |
MOSFET | Metal Oxide Semiconductor Field Effect Transistor |
MP | Maintenance Processor |
MP | Maintenance Processor |
MPCAG | Military Parts Control Advisory Group |
MPCAG | Military Parts Control Advisory Group |
MPMT | Mean Preventive Maintenance Time |
MRAP | Microcircuit Reliability Assessment Program |
MS | Management Strategy |
ms | Millisecond |
ms | Millisecond |
MS | Milestone |
MSA | Measurement Systems Analysis |
MSB | Most Significant Bit |
MSB | Most Significant Bit |
MSI | Medium Scale Integration |
MSI | Medium Scale Integration |
MTBCF | Mean Time Between Critical Failures |
MTBCF | Mean-Time-Between-Critical- Failure |
MTBD | Mean-Time-Between-Demand |
MTBD | Mean Time Between Demand |
MTBDE | Mean Time Between Downing Events |
MTBDE | Mean-Time-Between-Downing- Events |
MTBF | Mean Time Between Failure |
MTBF | Mean Time Between Failure |
MTBF | Mean-Time-Between-Failure |
MTBFF | Mean-Time-Between-Failure (Field)MTBFF |
MTBFF | Mean Time Between Functional Failure |
MTBM-IND | Mean-Time-Between- Maintenance-Induced (Type 2 Failure) |
MTBM-IND Mean Time Between Maintenance-Induced (Type 2 Failure) | |
MTBM-INH | Mean-Time-Between-Maintenance-Inherent (Type 1 Failure) |
MTBM-INH Mean Time Between Maintenance-Inherent (Type 1 Failure) | |
MTBM-ND | Mean-Time-Between- Maintenance-No Defect (Type 6 Failure) |
MTBM-ND | Mean Time Between Maintenance-No Defect (Type 6 failure) |
MTBM-P | Mean-Time-Between- Maintenance-Preventive |
MTBM-P | Mean Time Between Maintenance-Preventive |
MTBM-TOT | Mean-Time-Between- Maintenance-Total |
MTBM-TOT Mean Time Between Maintenance-Total | |
MTBMA | Mean-Time-Between- Maintenance-Actions |
MTBMA | Mean Time Between Maintenance Actions |
MTBMF | Mean-Time-Between- Maintenance (Field) |
MTBR | Mean Time Between Removals |
MTBR | Mean-Time-Between- Removals |
MTBRF | Mean-Time-Between- Removals (Field) |
MTBUMA | Mean-Time-Between- Unscheduled-Maintenance- Actions |
MTBUMA | Mean Time Between Unscheduled Maintenance Actions |
MTE | Multipurpose Test Equipment |
MTE | Minimal Test Equipment |
MTE | Multipurpose Test Equipment |
MTE | Minimal-Test-Equipment |
MTI | Moving Target Indicator |
MTI | Moving Target Indicator |
MTTE | Mean Time to Error |
MTTE | Mean-Time-To-Error |
MTTF | Mean Time To Failure |
MTTF | Mean Time to Failure |
MTTF | Mean-Time-To-Failure |
MTTR | Mean-Time-To-Repair |
MTTRS | Mean-Time-To-Restore- System |
MUX | Multiplexer |
MUX | Multiplexer |
MV | Mega Volt (Million Volt) |
MV | Mega Volt (Million Volt) |
MVF | Mean Value Function |
mW | Milliwatt |
mW | Milliwatt |
MWPS | Million Words Per Second |
MWPS | Million Words Per Second |
NASA | National Aeronautics and Space Administration |
NAVAIR | Naval Air Systems Command |
NCSA | National Center for Supercomputing Applications |
NDI | Nondevelopmental Items |
NDI | Nondevelopmental Item |
NDI | Nondevelopmental Items |
NDT | Nondestructive Testing |
NDT | Nondestructive Testing |
NHB | NASA Handbook |
NHPP | Nonhomogeneous Poisson Process |
NHPP | Non-Homogeneous Poisson Process |
NIST | National Institute of Standards and Technology |
NMOS | N-Channel Metal Oxide Semiconductor |
NMOS | N-Channel Metal Oxide Semiconductor |
NPRD | Nonelectronic Parts Reliability Data |
NPRD | Nonelectronic Parts Reliability Databook |
ns | Nanosecond |
ns | Nanosecond |
NS | Naval Sheltered |
NU | Naval Unsheltered |
NWSC | Naval Warfare Surface Center |
O&M | Operation and Maintenance |
O&M | Operation and Maintenance (synonymous with O&S) |
O&M | Operation and Maintenance |
O&S | Operation and Support |
O&S | Operation and Support |
O-Level | Organizational Level |
O-Level | Organizational Level |
OC | Operating Characteristic |
ODC | Orthogonal Defect Classification |
OEM | Original Equipment Manufacturer |
OEM | Original Equipment Manufacturer |
OMB | Office of Management and Budget |
OMB | Office of Management and Budget |
OMS/MP | Operations Mode Summary/Mission Profile |
OPEVAL | Operational Evaluation |
OPR | Office of Primary Responsibility |
OPR | Office of Primary Responsibility |
OPS | Operations Per Second |
OPS | Operations Per Second |
OPTEVFOR | Operational Test and Evaluation Force |
ORD | Operational Requirements Document |
ORD | Operational Requirements Document |
OROM | Optical Read Only Memory |
OROM | Optical Read Only Memory |
OS | Operating System |
OSD | Office of the Secretary of Defense |
OSD | Office of the Secretary of Defense |
OSD | Office of the Secretary of Defense |
OSS | Open-Source Software |
OT&E | Operational Test & Evaluation |
OT&E | Operational Test and Evaluation |
OTS | Off-The-Shelf |
OTS | Off-The-Shelf |
OUSD(AT&L) | Office of the Under Secretary of Defense for Acquisition, Technology and Logistics |
P | Power |
P | Percentile |
p | Probability |
P | Power |
PACAF | Pacific Air Forces |
PAL | Programmable Array Logic |
PAL | Programmable Array Logic |
PAT | Programmable Alarm Thresholds |
PAT | Process Action Team |
PAT | Process Action Team |
PAT | Programmable Alarm Thresholds |
PBL | Performance-Based Logistics or Performance-Based Life-Cycle Support |
PC | Printed Circuit |
PC | Printed Circuit |
PCA | Physical Configuration Audit |
PCA | Physical Configuration Audit |
PCB | Printed Circuit Board |
PCB | Printed Circuit Board |
PCO | Procuring Contracting Officer |
PCO | Procuring Contracting Officer |
Pd | Power Dissipation |
PD | Power Dissipation |
pdf | Probability Distribution Function |
PDF | Probability Density Function |
PDF | Probability Density Function |
PDL | Program Design Language |
PDL | Program Design Language |
PDR | Preliminary Design Review |
PDR | Preliminary Design Review |
PDR | Preliminary Design Review |
PEM | Plastic Encapsulated Microcircuit |
PEM | Program Element Monitor |
PFMEA | Process Failure Modes and Effects Analysis |
PGA | Pin Grid Array |
PGA | Pin Grid Array |
PGC | Planned Growth Curve |
PHA | Preliminary Hazard Analysis |
PIN | Positive Intrinsic Negative |
PIN | Positive Intrinsic Negative |
PLA | Programmable Logic Array |
PLA | Programmable Logic Array |
PLCC | Plastic Leadless Chip Carrier |
PLCC | Plastic Leadless Chip Carrier |
PLD | Programmable Logic Device |
PLD | Programmable Logic Device |
PM | Preventive Maintenance |
PM | Program Manager |
PM | Preventive Maintenance |
PM | Program Manager |
PM | Program Manager |
PM2 | AMSAA Projection Methodology - Continuous |
PM2-Discrete | AMSAA Projection Methodology - Discrete |
PMD | Program Management Directive |
PMD | Program Management Directive |
PMOS | P-Channel Metal Oxide Semiconductor |
PMOS | P-Channel Metal Oxide Semiconductor |
PMP | Parts, Materials and Processes |
PMP | Parts, Materials and Processes |
PMP | Program Management Plan |
PMP | Program Management Plan |
PMR | Program Management Review |
PMR | Program Management Review |
PMRT | Program Management Responsibility Transfer |
PMRT | Program Management Responsibility Transfer |
PO | Program Office |
PO | Program Office |
PoF | Physics-of-Failure |
Poly | Polycrystalline Silicon |
Poly | Polycrystalline Silicon |
PPM | Parts Per Million |
PPM | Parts Per Million |
ppm | Parts per Million |
PPSL | Preferred Parts Selection List |
PPSL | Preferred Parts Selection List |
PR | Process-Related |
PRAT | Production Reliability Acceptance Test |
PRAT | Production Reliability Acceptance Test |
PROM | Programmable Read Only Memory |
PROM | Programmable Read Only Memory |
PRR | Production Readiness Review |
PRR | Production Readiness Review |
PRST | Probability Ratio Sequential Test |
PRST | Probability Ratio Sequential Test |
PS | Power Supply |
PS | Power Supply |
PSAC | Parts Selection, Application and Control |
PSC | Preferred Screening Condition |
PSR | Program Support Review |
PTH | Plated-Through Hole |
PTH | Plated Through Hole |
PTH | Plated Through Hole |
PtSi | Platinum Silicide |
PtSi | Platinum Silicide |
PV | Present Value |
PW | Pulse Width |
PW | Pulse Width |
PWB | Printed Wiring Board |
PWB | Printed Wiring Board |
PWB | Printed Wiring Board |
QA | Quality Assurance |
QA | Quality Assurance |
QA | Quality Assurance |
QC | Quality Control |
QC | Quality Control |
QDR | Quality Deficiency Report |
QDR | Quality Deficiency Report |
QFD | Quality Function Deployment |
QFD | Quality Function Deployment |
QML | Qualified Manufacturers List |
QML | Qualified Manufacturers List |
QPL | Qualified Parts List |
QPL | Qualified Parts List |
QRAT | Quick Reliability Assessment ToolQT&E |
QSI | Quanterion Solutions Incorporated |
QT&E | Qualification Test and Evaluation |
QUMR | Quality Unsatisfactory Material Report |
QUMR | Quality Unsatisfactory Material Report |
R | Reliability |
R | Reliability |
R&D | Research and Development |
R&D | Research and Development |
R&M | Reliability and Maintainability |
R&M | Reliability and Maintainability |
R&M | Reliability & Maintainability |
RAC | Reliability Analysis Center |
RAD | Radiation |
RAD | Radiation |
RADC | Rome Air Development Center |
RADC | Rome Air Development Center (which became Rome Laboratory (RL), which became Air Force Research Laboratory (AFRL)) |
RAM | Random Access Memory |
RAM | Random Access Memory |
RAM | Reliability, Availability, Maintainability |
RAM | Random Access Memory |
RAM-C | Reliability, Availability, Maintainability and Cost |
RAMS | Reliability and Maintainability Symposium |
RAMS | Reliability and Maintainability Symposium |
RAMS | Reliability and Maintainability Symposium |
RCA | Root Cause Analysis |
RCM | Reliability Centered Maintenance |
RCM | Reliability-Centered Maintenance |
RD | Random Defect |
RD | Random Defect |
RDGD | Reliability Development Growth Test |
RDGD | Reliability Development Growth Test |
RDSON | On-Drain Source Resistance |
RDT | Reliability Demonstration Test |
RDT | Reliability Demonstration Test |
RDT | Reliability Development Test |
RDT&E | Research, Development, Test and Evaluation |
REG | Register |
REG | Register |
REMIS | Reliability and Maintainability Information System |
RF | Radio Frequency |
RF | Radio Frequency |
RFP | Request for Proposal |
RFP | Request for Proposal |
RFP | Request For Proposal |
RGC | Reliability Growth Curve |
RGT | Reliability Growth Test |
RGT | Reliability Growth Test |
RGTMC | Reliability Growth Tracking Model - Continuous |
RGTMD | Reliability Growth Tracking Model - Discrete |
RH | Relative Humidity |
RH | Relative Humidity |
RIAC | Reliability Information Analysis Center |
RISA | Reduced Instruction Set Architecture |
RISA | Reduced Instruction Set Architecture |
RISC | Reduced Instruction Set Computer |
RISC | Reduced Instruction Set Computer |
RIW | Reliability Improvement Warranty |
RIW | Reliability Improvement Warranty |
RL | Rome Laboratory |
RL | Rome Laboratory |
RL | Rome Laboratory |
RMS | Reliability, Maintainability and Supportability |
RMS | Root Mean Square |
RMS | Root Mean Square |
RMS | Reliability, Maintainability and Safety |
ROC | Required Operational Capability |
ROC | Required Operational Capability |
ROM | Read Only Memory |
ROM | Rough Order of Magnitude |
ROM | Rough Order of Magnitude |
ROM | Read Only Memory |
RPM | Reliability Planning Management |
RPN | Risk Priority Number |
RPP | Reliability Program Plan |
RQT | Reliability Qualification Test |
RQT | Reliability Qualification Test |
RQT | Reliability Qualification Test |
RR | Requirements Review |
RSA | Rapid Simulation Aids |
RSA | Rapid Simulation Aids |
RSR | Runtime Status Register |
RSR | Runtime Status Register |
RSS | Root-Sum-Squared |
RTL | Register Transfer Language |
RTL | Register Transfer Language |
RTOK | Retest OK |
RTOK | Retest Okay |
RTQC | Real Time Quality Control |
RTQC | Real Time Quality Control |
RV | Random Vibration |
RWG | Reliability Working Group |
S | Second |
S/N | Signal to Noise Ratio |
S/N | Serial Number |
S/N | Signal to Noise Ratio |
S/W | Software |
S/W | Software |
SA | Sneak Analysis |
SAE | Society of Automotive Engineers |
SAF | Secretary of the Air Force |
SAF | Secretary of the Air Force |
SAI | Statistical Applications Institute |
SAR | Synthetic Aperture Radar |
SAR | Synthetic Aperture Radar |
SAW | Surface Acoustic Wave |
SAW | Surface Acoustic Wave |
SBIR | Small Business Innovative Research |
SBIR | Small Business Innovative Research |
SC | Space Center |
SC | Space Center |
SCA | Sneak Circuit Analysis |
SCA | Sneak Circuit Analysis |
SCA | Sneak Circuit Analysis |
SCARLET | Sneak Circuit Analysis Rome Laboratory Engineering Tool |
SCARLET | Sneak Circuit Analysis Rome Laboratory Engineering Tool |
SCAT | Sneak Circuit Analysis Tool |
SCD | Specification Control Drawing |
SCD | Specification Control Drawing |
SCD | Source Control Drawing |
SCR | Silicon Control Rectifier |
SCR | Silicon Controlled Rectifier |
SDI | Strategic Defense Initiative |
SDL | System Description Language |
SDL | System Descriptive Language |
SDR | System Design Review |
SDR | System Design Review |
SDS | Structured Design System |
SDS | Structured Design System |
SE | Systems Engineering |
SE | Simultaneous Engineering |
SE | Support Equipment |
SE | Support Equipment |
SECDED | Single Error Correction, Double Error Detection |
SECDED | Single Error Correction, Double Error Detection |
SECDEF | Secretary of Defense |
SECDEF | Secretary of Defense |
SED | Single Error Detection |
SED | Single Error Detection |
SEDS | System Engineering Detailed Schedule |
SEDS | System Engineering Detailed Schedule |
SEM | Scanning Electron Microscope |
SEM | Standard Electronic Module |
SEM | Standard Electronic Module |
SEMI | Special Electromagnetic Interference |
SEMP | Systems Engineering Management Plan |
SEMP | Systems Engineering Management Plan |
SEMP | Systems Engineering Master Plan |
SEP | Systems Engineering Plan |
SER | Soft Error Rate |
SER | Soft Error Rate |
SERD | Support Equipment Recommended Data |
SERD | Support Equipment Recommended Data |
SEU | Single Event Upset |
SEU | Single Event Upset |
SF | Space Flight |
SHARP | Standard Hardware Acquisition and Reliability Program |
SIP | Single In-Line Package |
SIP | Single In-Line Package |
SMD | Standard Military Drawing |
SMD | Standard Military Drawing |
SMD | Surface Mounted Device |
SMD | Surface Mounted Device |
SMT | Surface Mounted Technology |
SMT | Surface Mount Technology |
SOA | Safe Operating Area |
SOA | State-Of-The-Art |
SOAR | State-of-the-Art Report |
SOI | Silicon On Insulator |
SOI | Silicon On Insulator |
SOIC | Small Outline Integrated Circuit |
SOIC | Small Outline Integrated Circuit |
SOLE | Society of Logistics Engineers |
SON | Statement of Need |
SON | Statement of Need |
SORD | Systems Operational Requirements Document |
SORD | Systems Operational Requirements Document |
SOS | Silicon On Sapphire |
SOS | Silicon On Sapphire |
SOW | Statement of Work |
SOW | Statement of Work |
SPAD | Scratch Pad Memory |
SPAD | Scratch Pad Memory |
SPC | Statistical Process Control |
SPC | Statistical Process Control |
SPC | Statistical Process Control |
SPEC | Specification |
SPLAN | AMSAA System Level Planning Model |
SPO | System Program Office |
SPO | System Program Office |
SQC | Statistical Quality Control |
SQC | Statistical Quality Control |
SR | Slew Rate |
SR | Slew Rate |
SRA | Shop Replaceable Assembly |
SRA | Shop Replaceable Assembly |
SRAM | Static Random Access Memory |
SRAM | Static Random Access Memory |
SRAP | Semiconductor Reliability Assessment Program |
SRD | Standard Reference Designator |
SRD | System Requirement Document |
SRD | System Requirement Document |
SRL | Shift Register Latch |
SRL | Shift Register Latch |
SRR | Systems Requirement Review |
SRR | Systems Requirement Review |
SRU | Shop Replaceable Unit |
SRU | Shop Replaceable Unit |
SSA | Source Selection Authority |
SSA | Software Sneak Analysis |
SSA | Source Selection Authority |
SSAC | Source Selection Advisory Council |
SSAC | Source Selection Advisory Council |
SSEB | Source Selections Evaluation Board |
SSEB | Source Selections Evaluation Board |
SSI | Small Scale Integration |
SSI | Small Scale Integration |
SSP | Source Selection Plan |
SSP | Source Selection Plan |
SSPA | Submicron Signal Processor Architecture |
SSPA | Submicron Signal Processor Architecture |
SSPLAN | AMSAA Subsystem Planning Model |
SSR | Software Specification Review |
SSR | Software Specification Review |
SSTRACK | AMSAA Subsystem Tracking Model |
ST | Self Test |
ST | Self Test |
STD | Standard |
STD | Standard |
STE | Special Test Equipment |
STE | Special Test Equipment |
STINFO | Scientific and Technical Information |
STINFO | Scientific and Technical Information |
STV | Steerable Television Set |
STV | Steerable Television Set |
SW | Software |
SWFMEA | Software Failure Modes and Effects Analysis |
t | Time |
T | Temperature |
t | Time |
T | Temperature |
T&E | Test and Evaluation |
T&E | Test and Evaluation |
T&E | Test & Evaluation |
T&M | Time and Materials |
Ta | Ambient Temperature |
Tc | Case Temperature |
Tj | Junction Temperature |
Tstg | Storage Temperature |
Ta | Ambient Temperature |
TAAF | Test, Analyze and Fix |
TAAF | Test-Analyze-and-Fix |
TAB | Tape Automated Bonding |
TAC | Tactical Air Command |
TAFT | Test-Analyze-Fix-test |
TBD | To Be Determined |
TBD | To Be Determined |
TBF | Time Between Failure |
TBF | Time Between (Successive) Failures |
TC | Temperature Cycle |
TC | Temperature Coefficient |
Tc | Case Temperature |
TC | Temperature Coefficient |
TCE | Thermal Coefficient of Expansion |
TCE | Thermal Coefficient of Expansion |
TCR | Temperature Coefficient of Resistance |
TCR | Temperature Coefficient of Resistance |
TDDB | Time Dependent Dielectric Breakdown |
TDDB | Time Dependent Dielectric Breakdown |
TDM | Time Division Multiplexing |
TDM | Time Division Multiplexing |
TDS | Technology Development Strategy |
TEMP | Test and Evaluation Master Plan |
TEMP | Test & Evaluation Master Plan |
TEMP | Test & Evaluation Master Plan |
TES | Test and Evaluation Strategy |
TET | Technical Evaluation Team |
TET | Technical Evaluation Team |
TFOM | Testability Figure of Merit |
Tj | Junction Temperature |
TLCC | Total Life Cycle Cost |
TLCC | Total Life Cycle Cost |
TM | Technical Manuals |
TM | Technical Manuals |
TM | Test Modules |
TM | Test Modules |
TMDE | Test Measurement and Diagnostic Equipment |
TMDE | Test Measurement and Diagnostic Equipment |
TMP | Test and Maintenance Processor |
TMP | Test and Maintenance Processor |
TO | Technical Orders |
TO | Technical Orders |
TP | AMSAA Threshold Program |
TPM | Technical Performance Measure |
TPS | Test Program Set |
TPS | Test Program Set |
TPWG | Test Plan Working Group |
TPWG | Test Plan Working Group |
TQM | Total Quality Management |
TQM | Total Quality Management |
TR | Technical Requirement |
TR | Technical Report |
TRD | Test Requirements Document |
TRD | Test Requirements Document |
TRR | Test Readiness Review |
TRR | Test Readiness Review |
TS | Storage Time |
TS | Test Statistic |
TSMD | Time Stress Measurement Device |
TSMD | Time Stress Measurement Device |
TSMD | Time Stress Measurement Device |
Tstg | Storage Temperature |
TTL | Transistor-Transistor Logic |
TTL | Transistor-Transistor Logic |
TTSF | Time-to-System-Failure (Failure Arrival Time) |
TTSF | Time to System Failure |
TWT | Traveling Wave Tube |
UCB | Upper Confidence Bound |
UCL | Upper Confidence Limit |
UCL | Upper Confidence Limit |
UHF | Ultra High Frequency |
UHF | Ultra High Frequency |
ULSI | Ultra Large Scale Integration |
ULSI | Ultra Large Scale Integration |
UMF | Universal Matched Filter |
UMF | Universal Matched Filter |
URL | Uniform Resource Locator |
USAF | United States Air Force |
USAFE | United States Air Forces in Europe |
USD(AT&L) | Under Secretary of Defense for Acquisition, Technology & Logistics |
USL | Upper Specification Limit |
USL | Upper Specification Limit |
USN | United States Navy |
UTS | Ultimate Tensile Strength |
UUT | Unit Under Test |
UUT | Unit Under Test |
UV | Ultraviolet |
UVPROM | Ultra-Violet Programmable Read Only Memory |
UVPROM | Ultra-Violet Programmable Read Only Memory |
V | Volt |
V | Volt |
VCE | Collector-Emitter Voltage |
VCP | Very High Speed Integrated Circuit Communications Processor |
VF | Forward Voltage |
VTH | Threshold Voltage |
VZ | Zener Voltage |
VCP | Very High Speed Integrated Circuit Communications Processor |
VGS | Visual Growth Suite |
VHDL | Very High Speed Integrated Circuit Hardware Description Language |
VHDL | Very High Speed Integrated Circuit Hardware Description Language |
VHSIC | Very High Speed Integrated Circuit |
VHSIC | Very High Speed Integrated Circuit |
VIM | Very High Speed Integrated Circuit Insertion Module |
VIM | Very High Speed Integrated Circuit Insertion Module |
VLSI | Very Large Scale Integration |
VLSI | Very Large Scale Integration |
VSM | Very High Speed Integrated Circuit Submicron |
VSM | Very High Speed Integrated Circuit Submicron |
VSP | Variable Site Parameters |
VSP | Variable Site Parameters |
VSWR | Voltage Standing Wave Ratio |
VTB | Very High Speed Integrated Circuit Technology Brassboard |
VTB | Very High Speed Integrated Circuit Technology Brassboard |
W | Watt |
WAM | Window Addressable Memory |
WAM | Window Addressable Memory |
WBS | Work Breakdown Structure |
WBS | Work Breakdown Structure |
WCA | Worst-Case Analysis |
WCCA | Worst Case Circuit Analysis |
WOLF | Work Order Logistics File |
WRA | Weapons Replaceable Assembly |
WRSK | War Readiness Spares Kit |
WRSK | War Readiness Spares Kit |
WSARA | Weapons System Acquisition Reform Act |
WSI | Wafer-Scale Integration |
WSI | Wafer-Scale Integration |
WSIC | Wafer-Scale Integrated Circuit |
WSIC | Wafer-Scale Integrated Circuit |
WUC | Work Unit Code |
WUC | Work Unit Code |
WWW | World Wide Web |
X | Reactance |
X | Reactance |
XCVR | Transceiver |
XCVR | Transceiver |
Y | Admittance |
Y | Admittance |
Z | Impedance |
Z | Impedance |
ZZ | Zener Impedance |
ZIF | Zero Insertion Force |
ZIF | Zero Insertion Force |